Recent Power MOSFET Test Results
The results of recent Single Event Effect (SEE) testing of newly available power MOSFETS are presented.
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Publications and source records attributed to Gauthier, Michael.
The results of recent Single Event Effect (SEE) testing of newly available power MOSFETS are presented.
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.