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Glenn, P.

Publications and source records attributed to Glenn, P..

Optical Surface Analysis Code (OSAC)

The purpose of this modification to the Optical Surface Analysis Code (OSAC) is to upgrade the PSF program to allow the user to get proper diffracted energy normalization even when deliberately obscuring rays with internal obscurations.

Glenn, P.

Computing Performance Of An Optical System

Collection of programs performs complicated ray-tracing and diffraction calculations. Optical Surface Analysis Code (OSAC) designed to provide comprehensive analysis of performance of optical system. Analyzes both conventional and x-ray systems. Composed of nine compatible programs executed in a sequence defined by user. Written in FORTRAN IV.

Glenn, P.

The design and implementation of the Technical Facilities Controller (TFC) for the Goldstone deep space communications complex

The Technical Facilities Controller is a microprocessor-based energy management system that is to be implemented in the Deep Space Network facilities. This system is used in conjunction with facilities equipment at each of the complexes in the operation and maintenance of air-conditioning equipment, power generation equipment, power distribution equipment, and other primary facilities equipment. The implementation of the Technical Facilities Controller was completed at the Goldstone Deep Space Communications Complex and is now operational. The installation completed at the Goldstone Complex is described and the utilization of the Technical Facilities Controller is evaluated. The findings will be used in the decision to implement a similar system at the overseas complexes at Canberra, Australia, and Madrid, Spain.

Killian, D. A.

Measurement of micro-roughness and effects of detector bandwidth and finite width

Surface micro-roughness of grazing incidence optics has long been recognized as a critical parameter in the control of the scattered X-ray intensity and its effects on the point spread function half-energy width. Accurate knowledge of the amplitude of surface micro-roughness is vital to assess optic predicted performance during the final stages of fabrication. This requires not only a knowledge of the spatial bandwidth over which surface features must be measured, but also knowledge of the bandwidth of the measurement instrument. We show that the standard assumption that instruments respond up to their Nyquist limit is an oversimplification which neglects the finite detector size and its bandwidth limiting effects when sampling a real (i.e., two-dimensional) surface.

Reid, P. B.