Engineering topics

Gonzalez, C. P.

Publications and source records attributed to Gonzalez, C. P..

At least 19 records

NASA NTRS2020

Genesis Mission Bulk Metallic Glass Solar Wind Collector: Characterization of Return Samples Available for Re-Allocation

The Genesis mission collected solar wind atoms for 28 months with a variety of collectors mounted on a spacecraft. A total of fifteen pure materials were selected as collectors based on engineering and science requirements. One of the materials was the bulk metallic glass (BMG). It was intended for collecting noble gases and solar energetic particles (SEP). This material is an amorphous metal which was custom made by C.C. Hays at the California Institute of Technology. The final glass composition is Zr58.5Nb2.8Cu15.6Ni12.8Al10.3 (in atom percent). The BMG was located on top of the wafer array mechanism and was exposed for the entire time the science canister was open (~28 months). Fortunately, the BMG did not suffer any serious damage and was intact after the Genesis canister’s “hard-landing” into the Utah desert (Fig. 1).

Gonzalez, C. P.↗

NASA NTRS2020

New Candidate Interstellar Particle in Stardust IS Aerogel Collector: Analysis by STXM and Ptychography

The Stardust Interstellar Preliminary Examination (ISPE) reported in 2014 the discovery of 7 probable contemporary interstellar (IS) particles captured in Stardust IS Collector aerogel and foils. The ISPE reports represented work done over 6 years by more than 60 scientists and >30,000 volunteers, which emphasizes the challenge identifying and analyzing Stardust IS samples was far beyond the primary Stardust cometary collection. We present a new potentially interstellar particle resulting from a continuation of analyses of the IS aerogel collection.

Butterworth, A. L.↗

NASA NTRS2020

TEM Characterization of Solar Wind Effects on Genesis Mission Silicon Collectors

The Genesis Discovery Mission passively allowed solar wind (SW) to implant into substrates during exposure times up to ~853 days from 2001 to 2004. The spacecraft then returned the SW to Earth for analysis. Substrates included semiconductor wafers (silicon, sapphire, and germanium), as well as a number of thin films supported by either silicon or sapphire wafers. During flight, subsets of the SW collectors were exposed to one of 4 SW regimes: bulk solar wind, coronal hole solar wind (CH, high speed), interstream solar wind (IS, low speed) or coronal mass ejections (CMEs). Each SW regime had a different composition and range of ion speeds and, during their collection, uniquely changed their host SW collector. This study focuses on bulk vs IS SW effects on CZ silicon.

Allums, K. K.↗

NASA NTRS2017

Genesis Solar Wind Interstream, Coronal Hole and Coronal Mass Ejection Samples: Update on Availability and Condition

Recent refinement of analysis of ACE/SWICS data (Advanced Composition Explorer/Solar Wind Ion Composition Spectrometer) and of onboard data for Genesis Discovery Mission of 3 regimes of solar wind at Earth-Sun L1 make it an appropriate time to update the availability and condition of Genesis samples specifically collected in these three regimes and currently curated at Johnson Space Center. ACE/SWICS spacecraft data indicate that solar wind flow types emanating from the interstream regions, from coronal holes and from coronal mass ejections are elementally and isotopically fractionated in different ways from the solar photosphere, and that correction of solar wind values to photosphere values is non-trivial. Returned Genesis solar wind samples captured very different kinds of information about these three regimes than spacecraft data. Samples were collected from 11/30/2001 to 4/1/2004 on the declining phase of solar cycle 23. Meshik, et al is an example of precision attainable. Earlier high precision laboratory analyses of noble gases collected in the interstream, coronal hole and coronal mass ejection regimes speak to degree of fractionation in solar wind formation and models that laboratory data support. The current availability and condition of samples captured on collector plates during interstream slow solar wind, coronal hole high speed solar wind and coronal mass ejections are de-scribed here for potential users of these samples.

Allton, J. H.↗

NASA NTRS2016

Genesis Solar Wind Science Canister Components Curated as Potential Solar Wind Collectors and Reference Contamination Sources

The Genesis mission collected solar wind for 27 months at Earth-Sun L1 on both passive and active collectors carried inside of a Science Canister, which was cleaned and assembled in an ISO Class 4 cleanroom prior to launch. The primary passive collectors, 271 individual hexagons and 30 half-hexagons of semiconductor materials, are described in. Since the hard landing reduced the 301 passive collectors to many thousand smaller fragments, characterization and posting in the online catalog remains a work in progress, with about 19% of the total area characterized to date. Other passive collectors, surfaces of opportunity, have been added to the online catalog. For species needing to be concentrated for precise measurement (e.g. oxygen and nitrogen isotopes) an energy-independent parabolic ion mirror focused ions onto a 6.2 cm diameter target. The target materials, as recovered after landing, are described in. The online catalog of these solar wind collectors, a work in progress, can be found at: http://curator.jsc.nasa.gov/gencatalog/index.cfm This paper describes the next step, the cataloging of pieces of the Science Canister, which were surfaces exposed to the solar wind or component materials adjacent to solar wind collectors which may have contributed contamination.

Allton, J. H.↗

NASA NTRS2016

Catastrophic Impact of Silicon on Silicon: Unraveling the Genesis Impact Using Sample 61881

The Genesis mission collected solar wind and brought it back to Earth in order to provide precise knowledge of solar isotopic and elemental compositions. The ions in the solar wind were stopped in the collectors at depths on the order of 10 to a few hundred nanometers. This shallow implantation layer is critical for scientific analysis of the composition of the solar wind and must be preserved throughout sample handling, cleaning, processing, distribution, preparation and analysis. The current work is motivated by the need to understand the interaction of the Genesis payload with contamination during the crash in the Utah desert. Silicon contamination has been found to be notoriously difficult to remove from silicon samples despite multiple cleanings with multiple techniques. However, the question has been posed, "Does the silicon really need to be removed for large area analyses?." If the recalcitrant silicon contamination is all pure silicon from fractured collectors, only a very tiny fraction of that bulk material will contain solar wind, which could skew the analyses. This could be complicated if the silicon trapped other materials and/or gases as it impacted the surface.

Kuhlman, K. R.↗

NASA NTRS2016

Small Particulate Contamination Survey Of Genesis Flight Sample 61423

The Genesis mission collected solar wind and brought it back to Earth in order to provide precise knowledge of solar isotopic and elemental compositions. The ions in the solar wind stop in the collectors at depths on the order of 10 to a few hundred nanometers. This shallow implantation layer is critical for scientific analysis of the composition of the solar wind and must be preserved throughout sample handling, cleaning, processing, distribution, preparation and analysis. We continue to work with the community of scientists analyzing Genesis samples using our unique laboratory facilities -- and, where needed, our unique cleaning techniques -- to significantly enhance the science return from the Genesis mission. This work is motivated by the need to understand the submicron contamination on the collectors in the Genesis payload as recovered from the crash site in the Utah desert, and -- perhaps more importantly -- how to remove it. We continue to evaluate the effectiveness of the wet-chemical "cleaning" steps used by various investigators, to enable them to design improved methods of stripping spacecraft and terrestrial contamination from surfaces while still leaving the solar-wind signal intact.

Kuhlman, K. R.↗

NASA NTRS2015

Genesis Solar Wind Samples: Update of Availability

The Genesis mission collected solar wind atoms for 28 months with a variety of collectors. The array wafer collector availability is displayed in the online catalog. The purpose of this report is to update the community on availability of array wafer samples and to preview other collectors which are in the process of being added to the online catalog. A total of fifteen pure materials were selected based on engineering and science requirements. Most of the materials were semiconductor wafers which were mounted on the arrays.

Gonzalez, C. P.↗

NASA NTRS2015

Enhanced Cleaning of Genesis Solar Wind Sample 61348 for Film Residue Removal

The Genesis mission returned to Earth on September 8, 2004, experiencing a nonnominal reentry. During the recovery of the collector materials from the capsule, many of the collector fragments were placed on the adhesive protion of post-it notes to prevent the fragments from moving during transport back to Johnson Space Center. This unknowingly provided an additional contaminate that would prove difficult to remove with the limited chemistries allowed in the Genesis Curation Laboratory. Generally when collector material samples are prepared for allocation to PIs, the samples are cleaned front side only with Ultra-Pure Water (UPW) via megasonic dispersion to the collector surface to remove crash debris and contamination. While this cleaning method works well on samples that were not placed on post-its during recovery, it has caused movement of the residue on the back of the sample to be deposited on the front in at least two examples. Therefore, samples placed on the adhesive portion on post-it note, require enhanced cleaning methods since post-it residue has proved resistant to UPW cleaning.

Allums, K. K.↗

NASA NTRS2015

Genesis Solar Wind Sample 61422: Experiment in Variation of Sequence of Cleaning Solvent for Removing Carbon-Bearing Contamination

The recovered Genesis collector fragments are heavily contaminated with crash-derived particulate debris. However, megasonic treatment with ultra-pure-water (UPW; resistivity (is) greater than18 meg-ohm-cm) removes essentially all particulate contamination greater than 5 microns in size [e.g.1] and is thus of considerable importance. Optical imaging of Si sample 60336 revealed the presence of a large C-rich particle after UPW treatment that was not present prior to UPW. Such handling contamination is occasionally observed, but such contaminants are normally easily removed by UPW cleaning. The 60336 particle was exceptional in that, surprisingly, it was not removed by additional UPW or by hot xylene or by aqua regia treatment. It was eventually removed by treatment with NH3-H2O2. Our best interpretation of the origin of the 60336 particle was that it was adhesive from the Post-It notes used to stabilize samples for transport from Utah after the hard landing. It is possible that the insoluble nature of the 60336 particle comes from interaction of the Post-It adhesive with UPW. An occasional bit of Post-It adhesive is not a major concern, but C particulate contamination also occurs from the heat shield of the Sample Return Capsule (SRC) and this is mixed with inorganic contamination from the SRC and the Utah landing site. If UPW exposure also produced an insoluble residue from SRC C, this would be a major problem in chemical treatments to produce clean surfaces for analysis. This paper reports experiments to test whether particulate contamination was removed more easily if UPW treatment was not used.

Allton, J. H.↗

NASA NTRS2015

Genesis Solar Wind Collector Cleaning Assessment: Update on 60336 Sample Case Study

To maximize the scientific return of Genesis Solar Wind return mission it is necessary to characterize and remove a crash-derived particle and thin film surface contamination. A small subset of Genesis mission collector fragments are being subjected to extensive study via various techniques. Here we present an update on the sample 60336, a Czochralski silicon (Si-CZ) based wafer from the bulk array (B/C). This sample has undergone multiple cleaning steps (see the table below): UPW spin wash, aggressive chemical cleanings (including aqua regia, hot xylene and RCA1), as well as optical and chemical (EDS, ToF-SIMS) imaging. Contamination appeared on the surface of 60336 after the initial 2007 UPW cleaning. Aqua regia and hot xylene treatment (8/13/2013) did little to remove contaminants. The sample was UPW cleaned for the third time and imaged (9/16/13). The UPW removed the dark stains that were visible on the sample. However, some features, like "the Flounder" (a large, 100 micron feature in Fig. 1b) appeared largely intact, resisting all previous cleaning efforts. These features were likely from mobilized adhesive, derived from the Post-It notes used to stabilize samples for transport from Utah after the hard landing. To remove this contamination, an RCA step 1 organic cleaning (RCA1) was employed. Although we are still uncertain on the nature of the Flounder and why it is resistant to UPW and aqua regia/hot xylene treatment, we have found RCA1 to be suitable for its removal. It is likely that the glue from sticky pads used during collector recovery may have been a source for resistant organic contamination [9]; however [8] shows that UPW reaction with crash-derived organic contamination does not make particle removal more difficult.

Goreva, Y. S.↗

NASA NTRS2014

Development of Genesis Solar Wind Sample Cleanliness Assessment: Initial Report on Sample 60341 Optical Imagery and Elemental Mapping

Since 2005 the Genesis science team has experimented with techniques for removing the contaminant particles and films from the collection surface of the Genesis fragments. A subset of ~40 samples have been designated as "cleaning matrix" samples. These are small samples to which various cleaning approaches are applied and then cleanliness is assessed optically, by TRXRF, SEM, ToF-SIMS, XPS, ellipsometry or other means [1-9]. Most of these sam-ples remain available for allocation, with cleanliness assessment data. This assessment allows evaluation of various cleaning techniques and handling or analytical effects. Cleaning techniques investigated by the Genesis community include acid/base etching, acetate replica peels, ion beam, and CO2 snow jet cleaning [10-16]. JSC provides surface cleaning using UV ozone exposure and ultra-pure water (UPW) [17-20]. The UPW rinse is commonly used to clean samples for handling debris between processing by different researchers. Optical microscopic images of the sample taken before and after UPW cleaning show what has been added or removed during the cleaning process.

Gonzalez, C. P.↗

NASA NTRS2014

Genesis Solar Wind Collector Cleaning Assessment: 60366 Sample Case Study

In order to recognize, localize, characterize and remove particle and thin film surface contamination, a small subset of Genesis mission collector fragments are being subjected to extensive study via various techniques [1-5]. Here we present preliminary results for sample 60336, a Czochralski silicon (Si-CZ) based wafer from the bulk array (B/C).

Goreva, Y. S.↗

NASA NTRS2014

ToF-SIMS Investigation of the Effectiveness of Acid-Cleaning procedures for Genesis Solar Wind Collectors

ToF-SIMS images of Genesis sample surfaces contain an incredible amount of important information, but they also show that the crash-derived surface contamination has many components, presenting a challenge to cleaning. Within the variability, we have shown that there are some samples which appear to be clean to begin with, e.g. 60471, and some are more contaminated. Samples 60493 and 60500 are a part of a focused study of the effectiveness of aqua regia and/or sulfuric acid cleaning of small flight Si implanted with Li-6 using ToF-SIMS.

Goreva, Y. S.↗

NASA NTRS2014

Cellulose Acetate Replica Cleaning Study of Genesis Non-Flight Sample 3CZ00327

The Genesis mission collected solar wind and brought it back to Earth in order to provide precise knowledge of solar isotopic and elemental compositions. The ions in the solar wind were stopped in the collectors at depths on the order of 10 to a few hundred nanometers. This shallow implantation layer is critical for scientific analysis of the composition of the solar wind and must be preserved throughout sample handling, cleaning, processing, distribution, preparation and analysis. We are working interactively with the community of scientists analyzing Genesis samples, using our unique laboratory facilities -- and, where needed, our unique cleaning techniques -- to significantly enhance the science return from the Genesis mission. This work is motivated by the need to understand the submicron contamination on the collectors in the Genesis payload as recovered from the crash site in the Utah desert, and -- perhaps more importantly -- how to remove it. That is, we are evaluating the effectiveness of the wet-chemical "cleaning" steps used by various investigators, to enable them to design improved methods of stripping terrestrial contamination from surfaces while still leaving the solar-wind signal intact.

Kuhlman, K. R.↗

NASA NTRS2014

Investigation of Backside Textures for Genesis Solar Wind Silicon Collectors

Genesis solar wind collectors were comprised of a suite of 15 types of ultrapure materials. The single crystal, pure silicon collectors were fabricated by two methods: float zone (FZ) and Czochralski (CZ). Because of slight differences in bulk purity and surface cleanliness among the fabrication processes and the specific vendor, it is desirable to know which variety of silicon and identity of vendor, so that appropriate reference materials can be used. The Czochralski method results in a bulk composition with slightly higher oxygen, for example. The CZ silicon array wafers that were Genesis-flown were purchased from MEMC Electronics. Most of the Genesis-flown FZ silicon was purchased from Unisil and cleaned by MEMC, although a few FZ wafers were acquired from International Wafer Service (IWS).

Gonzalez, C. P.↗

NASA NTRS2013

Cleaning Study of Genesis Sample 60487

The Genesis mission collected solar wind and brought it back to Earth in order to provide precise knowledge of solar isotopic and elemental compositions. The ions in the solar wind were stopped in the collectors at depths on the order of 10 to a few hundred nanometers. This shallow implantation layer is critical for scientific analysis of the composition of the solar wind and must be preserved throughout sample handling, cleaning, processing, distribution, preparation and analysis. Particles of Genesis wafers, brine from the Utah Testing Range and an organic film have deleterious effects on many of the high-resolution instruments that have been developed to analyze the implanted solar wind. We have conducted a correlative microscopic study of the efficacy of cleaning Genesis samples with megasonically activated ultrapure water and UV/ozone cleaning. Sample 60487, the study sample, is a piece of float-zone silicon from the B/C array approximately 4.995mm x 4.145 mm in size

Kuhlman, Kim R.↗

NASA NTRS2013

Examples of Optical Assessment of Surface Cleanliness of Genesis Samples

Optical microscope assessment of Genesis solar wind collector surfaces is a coordinated part of the effort to obtain an assessed clean subset of flown wafer material for the scientific community. Microscopic survey is typically done at 50X magnification at selected approximately 1 square millimeter areas on the fragment surface. This survey is performed each time a principle investigator (PI) returns a sample to JSC for documentation as part of the established cleaning plan. The cleaning plan encompasses sample handling and analysis by Genesis science team members, and optical survey is done at each step in the process. Sample surface cleaning is performed at JSC (ultrapure water [1] and UV ozone cleaning [2]) and experimentally by other science team members (acid etch [3], acetate replica peels [4], CO2 snow [5], etc.). The documentation of each cleaning method can potentially be assessed with optical observation utilizing Image Pro Plus software [6]. Differences in particle counts can be studied and discussed within analysis groups. Approximately 25 samples have been identified as part of the cleaning matrix effort to date.

Rodriquez, Melissa C.↗