Double-layer interference in air-CdS films.
Optical thickness measurement of nonabsorbing dielectric film when it is inconvenient to apply overlay film to measure thickness by Fizeau fringe shift
CADMIUM SULFIDE↗
Engineering topics
Publications and source records attributed to Gottling, J. G..
Optical thickness measurement of nonabsorbing dielectric film when it is inconvenient to apply overlay film to measure thickness by Fizeau fringe shift
Electrical conduction properties of vacuum evaporated thin cadmium sulfide films