Characterizing mid-circuit measurements with a new form of gate set tomography Part 2: Experiment.
Abstract not provided.
Ribeill, Guilhem↗
Engineering topics
Govia, Luke
Publications and source records attributed to Govia, Luke.
Characterizing mid-circuit measurements with a new form of gate set tomography Part 1: Theory.
Abstract not provided.
Rudinger, Kenneth Michael↗
Characterizing mid-circuit measurements with a new form of gate set tomography part 1: Theory.
Abstract not provided.
Rudinger, Kenneth Michael↗
Characterizing mid-circuit measurements with a new form of gate set tomography part 2: Experiment.
Abstract not provided.
Ribeill, Guilhem↗
Calibrating two-qubit gates via robust phase estimation.
Abstract not provided.
Rudinger, Kenneth Michael↗