Engineering topics

Grant, Lois

Publications and source records attributed to Grant, Lois.

4 records

NASA NTRS1993

Polarized and specular reflectance variation with leaf surface features

The linearly polarized reflectance from a leaf depends on the characteristics of the leaf surface. In the present study the leaf reflectance of a number of plant species with varying surface characteristics was measured at the Brewster angle with a polarization photometer having 5 visible and near-infrared wavelength bands. We found that all leaf surfaces polarized incident light. Differences among species could be explained by variation in surface features. The results support our hypothesis that the polarized light is reflected by the leaf surface, not by its interior. Two mechanisms appeared responsible for the linearly polarized reflectance: (1) specular reflectance and (2) surface particle scattering. In most cases, large values of linearly polarized reflectance could be attributed to specular reflectance from the leaf surface. Attribution required knowledge of the optical dimensions of features on the leaf surface.

Grant, Lois↗

NASA NTRS1987

Diffuse and specular characteristics of leaf reflectance

In this paper, the evolution of current understanding of the mechanisms of leaf reflectance is reviewed. The use of measurements of polarized reflectance to separate leaf reflectance into diffuse and specular components is discussed. A section on the factors influencing leaf reflectance - leaf structure and physiological disturbances - is included along with discussion on the manner in which these influences are manifested.

Grant, Lois↗

NASA NTRS1987

Variations in the polarized leaf reflectance of Sorghum bicolor

The polarized reflectance factor, Rq, of sorghum (Sorghum bicolor, L.) leaves from field-grown plants was measured in situ in the summers of 1983 and 1984. In 1983, three leaves of two randomly selected plants were measured at 2-week intervals. The value of Rq varied, depending on leaf and day of measurement. Measured values of Rq for the adaxial leaf surface ranged from 16 to 53; for the abaxial leaf surface the values ranged from 28 to 69. In 1984, measurements consisted of repeated observations made on the same leaf at biweekly intervals. The values of Rq from the adaxial leaf surface ranged from 26 to 38. Values of Rq from the abaxial leaf surface increased throughout the season, from 16 to 45. Differences in Rq were attributed to changes in surface details of the leaf.

Grant, Lois↗

NASA NTRS1987

Polarized and non-polarized leaf reflectances of Coleus blumei

A polarization photometer has been used to measure the reflectance of three variegated portions of Coleus blumei, Benth. in five wavelength bands of the visible and near-infrared spectrum. The polarized component of the reflectance factor was found to be independent of wavelength, indicating that the polarized reflectance arises from the leaf surface. It is suggested that differences in the polarized component result from variations in surface features. The nonpolarized component of the reflectance factor is shown to be related to the internal leaf structure. The variation of the degree of polarization with wavelength was found to be greatest in the regions of the spectrum where absorption occurs.

Grant, Lois↗