Engineering topics
Publications and source records attributed to Greeley, Jeffrey P..
X-ray characterization of catalyst materials using synchrotron radiation has become more widely available to the scientific community in recent decades.
Catalysts comprising a Ta layer having an outer layer with a layer comprising Pt directly thereon, wherein the Ta layer has an average thickness in a range from 0.04 to 30 nanometers, wherein the layer comprising Pt has an average thickness in a range from 0.04 to 50 nanometers, and wherein the Pt and Ta are present in an atomic ratio in a range from 0.01:1 to 10:1. Catalyst described herein are useful, for example, in fuel cell membrane electrode assemblies.