Engineering topics
Guertin, Steven
Publications and source records attributed to Guertin, Steven.
Options for Radiation Tolerant High-Performance Memory
Memory technologies were reviewed for radiation effects performance in order to determine the most cost-efficient target for a possible memory investment targeted at creating a memory component of general applicability for space use. TID and SEL trends that had indicated improvement in intrinsic performance based on scaling cannot be trusted. SEE hardening of memory arrays is prohibitive in terms of cell-level power and area requirements. Radiation-hardened cells and custom controllers are recommended for future memory developments.
Towards a Qualification Data Set: Expanded SEE Data on the P2020 Processor
Earlier P2020 SEE data are compared and expanded to a recent die revision, significantly increasing samples tested by protons by five devices, and by heavy ions by five devices. Earlier tested SEE types are found to be fairly similar in register, L1 cache, L2 cache, and CPU crashes. New test methods give SEE performance for the flash memory controller, watchdog circuit, and a built-in Ethernet port on the P2020 processor. Results from heavy ion and proton tests are presented, with data separated over a large number of specific error types and test programs.
SEE Test Results for the Snapdragon 820
SEE test results are presented for proton, neutron, and heavy ion testing of the Qualcomm Snapdragon 820 and its support DDR4 device (in this case the SK Hynix 24 Gb LP DDR4 device H9HKNNNDGUMUBR-NMH). Processor crashes and DDR4 stuck bits are the primary SEE types for protons and neutrons. Test preparation difficulties and software limitations caused test efforts to be limited to processor crashes, SEFIs and SBU, and Stuck Bits in the DDR4 device. Interpretation of results is complicated by mixing of errors between devices.
Team Update on North American Proton Facilities for Radiation Testing
In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation provides an overview of the options for North American proton facilities. This includes those in use by the aerospace community as well as new additions from the cancer therapy regime. In addition, proton single event testing background is provided for understanding the criteria needed for these facilities for electronics testing.
Team Update on North American Proton Facilities for Radiation Testing
In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation provides an overview of the options for North American proton facilities. This includes those in use by the aerospace community as well as new additions from the cancer therapy regime. In addition, proton single event testing background is provided for understanding the criteria needed for these facilities for electronics testing.
Team Update on North American Proton Facilities for Radiation Testing
In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation provides an overview of the options for North American proton facilities. This includes those in use by the aerospace community as well as new additions from the cancer therapy regime. In addition, proton single event testing background is provided for understanding the criteria needed for these facilities for electronics testing.
Team Update on North American Proton Facilities for Radiation Testing
In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation provides an overview of the options for North American proton facilities. This includes those in use by the aerospace community as well as new additions from the cancer therapy regime. In addition, proton single event testing background is provided for understanding the criteria needed for these facilities for electronics testing.
Dynamic and Static Cache SEE Results for a 49-Core Processor
Recent dynamic and static results are presented on a 49-core RHBD processor. Dynamic cache results show increased SEE susceptibility over static tests.