Multifrequency Imaging in the Intermittent Contact Mode of Atomic Force Microscopy: Beyond Phase Imaging
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catalysis (heterogeneous)↗
Engineering topics
Guo, Senli
Publications and source records attributed to Guo, Senli.
Half-harmonic Kelvin probe force microscopy with transfer function correction
An approach for surface potential imaging based on half-harmonic band excitation (BE) in Kelvin probe force microscopy is demonstrated. Using linear and half-harmonic BE enables quantitative correction of the cantilever transfer function. Half-harmonic band excitation Kelvin probe force microscopy (HBE KPFM) thus allows quantitative separation of surface potential and topographic contributions to the signal, obviating the primary sources of topographic cross-talk. HBE KPFM imaging and voltage spectroscopy methods are illustrated for several model systems.
Guo, Senli↗
Open-loop Band excitation Kelvin Probe Force Microscopy
A multidimensional scanning probe microscopy approach for quantitative, cross-talk free mapping of surface electrostatic properties is demonstrated. Open-loop band excitation Kelvin probe force microscopy (OL BE KPFM) probes the full response-frequency-potential surface at each pixel at standard imaging rates. The subsequent analysis reconstructs work function, tip surface capacitance gradient and resonant frequency maps, obviating feedback-related artifacts. OL BE KPFM imaging is demonstrated for several materials systems with topographic, potential and combined contrast. This approach combines the features of both frequency and amplitude KPFM and allows complete decoupling of topographic and voltage contributions to the KPFM signal.
77 NANOSCIENCE AND NANOTECHNOLOGY↗