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Gurgew, Danielle

Publications and source records attributed to Gurgew, Danielle.

4 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2023

ASCENT: a balloon-borne hard x-ray imaging spectroscopy telescope using transition edge sensor microcalorimeter detectors

Core collapse supernovae are thought to be one of the main sources in the galaxy of elements heavier than iron. Understanding the origin of the elements is thus tightly linked to our understanding of the explosion mechanism of supernovae and supernova nucleosynthesis. X-ray and gamma-ray observations of young supernova remnants, combined with improved theoretical modeling, have resulted in enormous improvements in our knowledge of these events. Here, the isotope Ti44 is one of the most sensitive probes of the innermost regions of the core collapse engine, and its spatial and velocity distribution are key observables. Hard x-ray imaging spectroscopy with the Nuclear Spectroscopic Telescope Array (NuSTAR) has provided new insights into the structure of the supernova remnant Cassiopeia A (Cas A), establishing the convective nature of the supernova engine. However, many questions about the details of this engine remain. We present here the concept for a balloon-borne follow-up mission called A SuperConducting ENergetic x-ray Telescope (ASCENT). ASCENT uses transition edge sensor gamma-ray microcalorimeter detectors with a demonstrated 55-eV full-width half maximum energy resolution at 97 keV. This 8- to 16-fold improvement in energy resolution over NuSTAR will allow for high-resolution imaging and spectroscopy of the Ti44 emission. This will allow for a detailed reconstruction of gamma-ray line redshifts, widths, and shapes, allowing us to address questions such as, What is the source of the neutron star kicks? What is the dominant production pathway for Ti44? Is the engine of Cas A unique?

79 ASTRONOMY AND ASTROPHYSICS↗
NASA NTRS2017

Stress Compensating Multilayers

We present in-situ stress measurement results for single and multilayer thin-films deposited by magnetron sputtering. In particular, we report on the influence of the material interfaces on the ensuing stress in both the transient and steady-state regimes of film growth. This behavior is used to determine the appropriate thicknesses of the constituent layers that will result in a net tensile stress in multilayers composed of various material combinations. These multilayers can then be used to compensate the compressive integrated stress in single and multilayer EUV and x-ray optical coatings. The use of multilayers to compensate the integrated stress might be advantageous because, unlike single layers of chromium, the roughness is not expected to increase with the total thickness of the multilayer. In this paper, we demonstrate the technique for W/Si and Mo/Si multilayers and discuss its application to other material combinations.

Multilayer↗
NASA NTRS2015

Achieving Zero Stress in Iridium, Chromium, and Nickel Thin Films

We examine a method for achieving zero intrinsic stress in thin films of iridium, chromium, and nickel deposited by magnetron sputter deposition. The examination of the stress in these materials is motivated by efforts to advance the optical performance of light-weight x-ray space telescopes into the regime of sub-arc second resolution that rely on control of the film stress to values within 10-100 MPa. A characteristic feature of the intrinsic stress behavior in chromium and nickel is their sensitivity to the magnitude and sign of the intrinsic stress with argon gas pressure, including the existence of a critical pressure that results in zero film stress. This critical pressure scales linearly with the film's density. While the effect of stress reversal with argon pressure has been previously reported by Hoffman and others for nickel and chromium, we have discovered a similar behavior for iridium. Additionally, we have identified zero stress in iridium shortly after island coalescence. This feature of film growth is used for achieving a total internal stress of -2.89 MPa for a 15.8 nm thick iridium film. The surface roughness of this low-stress film was examined using scanning probe microscopy (SPM) and x-ray reflectivity (XRR) at CuKα and these results presented and discussed.

X-ray↗