Engineering topics

H Muramatsu

Publications and source records attributed to H Muramatsu.

3 records

NASA NTRS2026

Optimization of X-ray Absorbers for High-Resolution TES Detectors in NewATHENA X-IFU

NewATHENA’s X-ray Integral Field Unit (X-IFU) uses a large-format array of Transition Edge Sensor (TES) microcalorimeters coupled with absorbers made of gold and bismuth providing 4 eV FWHM resolution up to 7 keV in the 0.2- 12 keV band. X-ray absorbers must be thick enough for photon absorption, maintain low heat capacity for energy resolution, and have good thermalization properties. The X-IFU requires total Quantum Efficiency (QE) of 96%, 87%, and 63% at 1, 7, and 9.5 keV, respectively. Optimal thicknesses are 1.05 µm gold and 5.5 µm bismuth to achieve 0.731 pJ/K at 90 mK and 87% QE at 7 keV. While typical TES absorbers are 3-4 µm thick, producing the required 5.5 µm Bi absorbers via standard electroplating creates enlarged grains and surface roughness. The increased roughness and grain size variability produced with our standard recipe have resulted in instances of 1) low energy spectral tails 2) spectral broadening of the energy resolution and 3) thermal shorts between pixels when a large grain bridges the gap between absorbers. In this study, we have introduced a new fabrication process and altered the morphology of the thick Bi through changes in the electroplating process. The process changes are intended to address all three issues as well as reduce particulate contamination observed on the finished detector arrays.

Absorber↗

NASA NTRSDate not supplied

Effect of Space Radiation on TES Detectors Performance

The Athena mission and its X-IFU instrument (X-ray Integral Field Unit) will be positioned at the Sun-Earth Lagrangian point L1, where it will be subject to solar wind (low flux plasma of 95% protons and 5% alpha particles) with energy below 0.1 MeV, and to galactic cosmic rays and solar flares (energetic protons, alpha particles, and electrons) with energies up to hundreds of MeV for protons and the GeV for heavier ions. Some of these particles will go through the satellite and hit the focal plane assembly and hence the detectors. These detectors will be TES (Transition-edge sensor) microcalorimeters, flown for the first time in such an environment. In order to ensure the performance of this type of detectors throughout the duration of such mission, it is critical to study the impact of the radiation on their behavior. Indeed, although a lot of reference material exist for semiconductor detectors such as CCDs, little is currently known about the impact of radiation on TES detectors. These energetic events could cause local heating or damage to the detectors and affect their performance. In this work, we describe how we designed a test campaign to assess the impact of L1 radiation on TES detectors for Athena/X-IFU-like missions and present the results of the tests. Analyses includes assessing changes in the pulse shapes and energy resolution of the detectors measured at 55 mK after several radiation dose steps performed at 4 K.

Sophie Beaumont↗

NASA NTRSDate not supplied

Long Term Performance Stability of TES Detectors

We are developing superconducting transition-edge sensor (TES) microcalorimeter arrays for a variety of applications such as ground-based laboratory astrophysics experiments and next generation space-based X-ray missions. These detectors can provide X-ray spectral information with an unprecedent resolution of ~2 eV at 6 keV and have been selected for the X-ray Integral Field Unit (X-IFU) instrument of ESA’s large flagship mission Athena. To maintain detector performance over the lifetime of the mission, it is important to understand whether environmental conditions that the detector may be exposed to will affect its properties over time. This “aging” begins right after the array leaves the fabrication environment, with potential exposure to humidity, oxygen, or elevated temperatures which may affect the detector performance. In a few prior arrays we have observed increased fall times in the pulse shape and/or the introduction of anomalous low energy tails on the X-ray spectrum. This is thought to be an indication of “aging” on chips exposed to such conditions, causing e.g. changes in the absorber properties. In this contribution, we report on a systematic characterization of TES properties, before and after exposing the chip to various controlled temperature and humidity levels and assess the changes in the measured transition and pulse shapes, energy resolution, and spectral redistribution.

S Beaumont↗