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Hacke, Peter L.

Publications and source records attributed to Hacke, Peter L..

Diagnosis of PV Cell Passivation Degradation Resulting from Hot-Humid, High Voltage Potential Aging

Corrosion of the antireflective coating on the cell ("AR c corrosion") was previously observed in studies using hot-humid test conditions with external high voltage (HV) bias. Because AR c corrosion is not well understood, mini-modules (MiMos) were examined in a comparative experiment using PERC and PERT as well as legacy Al-BSF cells. For separate MiMos with the cell circuit electrical at +1500 V, -1500 V, or unbiased "V oc", test conditions in the comparative study included 60degrees C/60% RH for 96 h, as in IEC TS 62804-1; 70degrees C/70%RH for 200 h; and 85degrees C/85% RH for 200 h. Characterizations at each read point included: camera and electroluminescence (EL) imaging, colorimetry, and I-V curve tracing. Characterizations at the final read point included: SunsVoc; spatially mapping external quantum efficiency (EQE); high resolution: photoluminescence (PL), EL, and dark lock-in thermographic (DLIT) imaging. Forensics were performed on extracted cores, including scanning electron microscopy (SEM) with energy-dispersive X-ray spectroscopy (EDS) and scanning Auger microscopy (SAM). Forensics were also conducted on MiMos (stepped HV aging) and full-sized modules (outdoor aging) from previous studies. AR c corrosion was specifically observed for the glass/encapsulant/cell side of +1500 V (HV+) stressed MiMos, where appearance, color, and reflectance were the characteristics most distinguished relative to simultaneously occurring degradation modes. SEM/EDS and SAM identified conversion of silicon nitride to silicon oxide or hydrous silica, preferentially occurring at the edges and tips of the pyramidal textured cell surface.

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2024 Photovoltaic Inverter Reliability Workshop Summary Report & Proceedings

The National Renewable Energy Laboratory (NREL) organized the 2024 Photovoltaic Inverter Reliability Workshop on April 11-12, 2024, hosted at NREL's South Table Mountain campus in Golden, Colorado. The workshop was organized around seven key topics, including the present state of inverter reliability; solutions for reliability challenges; life cycle cost and ownership issues; testing, standards, performance, and reliability metrics; data reporting, analytics, and sharing; and the future of PV inverter reliability research. Participants included inverter manufacturers, national laboratory researchers, academics, independent testing laboratories, and more. Over the course of the two-day workshop, attendees arrived at several key priorities and conclusions. This report summarizes these conclusions and then collects presentations from the workshop into a record of the workshop's proceedings.

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Photovoltaic Cable Connectors: A Comparative Assessment of the Present State of the Industry

The consequences of failure for balance-of-systems components (such as photovoltaic (PV) cable connectors) include offline module string(s); low system voltage; arc, ground, insulation, and overtemperature faults; triggered fuse(s); system shutdown; and fire. The degradation modes for connectors are studied here through an industry survey and its subsequent examination, which are compared with field-degraded specimens. A total of 117 specimens were obtained from a variety of locations and climates or accelerated tests. A failure analysis for connectors from PV installations was developed (and applied to 54 specimens), including nondestructive examinations (photography, a custom resistance-current scan, and X-ray computed tomography) and destructive examinations (featuring milling of the external plastic, extraction of the internal convolute spring, and potting and polishing in cross section). Surface and through-thickness composition of the metal pins and springs was quantified using scanning electron microscopy with energy-dispersive X-ray spectroscopy. Fourier transform infrared spectroscopy was used to verify the base polymer materials and compare the chemical structure of the connector body, bushing, end nut, and o-ring. Thermogravimetric analysis and differential scanning calorimetry were used to further verify the degradation of the same polymeric components.

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Photovoltaic Inverter Reliability Assessment

As the price of PV modules drops, the price of power electronics become more important. Power electronics now constitute 8%-12% of the total lifetime PV cost. As of 2010, the inverter and associated power conditioning components accounted for $\$0.25$/W, well above the DOE benchmark of $\$0.12$/W by 2020. As efforts to reduce PV module costs yield diminishing returns, the importance of understanding and reducing inverter costs becomes an increasingly critical and cost-effective investment toward achieving the DOE SunShot goals. With this in view, this report showcases and describes an approach to help assess and predict the reliability of photovoltaic (PV) inverters. To predict the reliability, thermal cycling is considered as a prominent stressor in the inverter system. To evaluate the impacts of thermal cycling, a detailed linearized model of the PV inverter is developed along with controllers. This research also develops models and methods to compute the losses of the power electronics switches and other components in a PV inverter. The losses are then used to estimate the junction and heat sink temperature. The model is verified by developing an in-house inverter. Additionally, to assess the scalability of the research, the hardware inverter is placed inside a thermal chamber to verify the losses for different ambient temperatures. After the verification of the model, a reduced-order model of the inverter is implemented to translate the profile of ambient temperature and solar irradiance into the profile of junction temperatures of the switches. The estimated junction temperature data are used to identify inverter reliability indices and predict the useful lifetime of the inverter system. After developing the models to predict the useful lifetime of the system, the impact of reactive power on the overall reliability of the system will be studied. The first chapter involves the motivation behind the research on assessing the reliability of PV inverters. The inverter power stage and controller design of the power converter used in this research is also explained in detail in this chapter. The second chapter presents the various losses of the power converter system and the translation of power loss into temperature increase with thermal modeling. The results of the loss modeling and the thermal modeling are also explained in detail in this chapter. The third chapter involves implementing the reduced-order model to translate the mission profile of ambient temperature and solar irradiance into profile of the junction temperatures of the switches. The final chapter involves identifying reliability indices, which are of interest for this system to predict the remaining useful life of the system, and concludes with the impact of reactive power on the overall reliability of the inverter system.

14 SOLAR ENERGY↗

From Modules to Atoms: Techniques and Characterization for Identifying and Understanding Device-Level Photovoltaic Degradation Mechanisms

This report documents how degraded modules are analyzed for the characterization of cell-level performance reduction. The primary degradation topics presented here are 1) potential-induced degradation, 2) defect metastability and impurity diffusion, and 3) partial-shading-induced reverse-bias breakdown. Imaging techniques, such as electroluminescence imaging, photoluminescence imaging, and lock-in thermography provide spatial information of full modules on the meter scale. Area of interest can then be imaged with higher spatial resolution by zooming in with fields of view near the mm scale. We document procedures for coring cell samples from selected regions of interest using mechanical drilling. The small samples are then of suitable size for various microscopic analyses using techniques such as scanning electron microscopy, time-of-flight secondary ion spectrometry, atomic force microscopy, electron beam induced current, transmission electron microscopy, and atom probe tomography, which can provide chemical, structural, and electrical characterization down to the atomic scale.

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