Engineering topics
Publications and source records attributed to Hansel, S. J..
The sixth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications in December issues of IEEE - Nuclear Science Transactions for 1985, 1987, 1989, 1991, and the IEEE Workshop Record, 1993. Trends in SEE susceptibility (including soft errors and latchup) for state-of- are evaluated.
The paper discusses salient features of the SAMPEX Data Processing Unit (DPU), the primary function of which is to collect sensor data to create telemetry packets for transmission to the solid-state recorder located within the Small Explorer Data System. Particular attention is given to the sensor interface electronics, the space command interface, the spacecraft telemetry interface, and the memory mapper of the DPU system; the task scheduling concept; and system reconfiguring. A block diagram of the DPU system is included.
JPL and the Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are displayed. All data are conveniently divided into two tables: one for MOS devices, and one for a shorter list of recently tested bipolar devices. In addition, a new table of data for latchup tests only (invariably CMOS processes) is given.