Engineering topics

Hansknecht, John

Publications and source records attributed to Hansknecht, John.

4 records

DOE OSTI2020

New Simulations for Ion-Production and Back-Bombardment in GaAs Photo-guns

GaAs-based DC high voltage photo-guns used at accelerators with extensive user programs must exhibit long photocathode operating lifetime. Achieving this goal represents a significant challenge for proposed high average current facilities that must operate at tens of milliamperes or more. Specifically, the operating lifetime is dominated by ion back-bombardment of the photocathode from ionized residual gas. While numerous experiments have been performed to characterize the operating lifetime under various conditions, detailed simulations of the ion back-bombardment mechanism that explains these experiments are lacking. Recently, a new user routine was implemented using the code General Particle Tracer (GPT) to simulate electron impact ionization of residual beam line gas and simultaneously track the incident electron, the ejected electron, and the newly formed ion. This new routine was benchmarked against analytical calculations and then applied to experiments performed at the CEBAF injector at the Thomas Jefferson National Accelerator Facility to study the effectiveness of limiting ions from entering the cathode-anode gap using a positively biased anode. These simulations were performed using detailed 3D field maps produced with CST Microwave Studio describing the photo-gun electrostatics. Discussion of the experiment and the application of this new GPT routine to model the experiments will be presented at the workshop.

Yoskowitz, Joshua↗

DOE OSTI2019

Operational results of simultaneous four-beam delivery at Jefferson Lab

A concept for simultaneous beam delivery to all four CEBAF experimental halls from a single injector and a single main accelerator for the 12 GeV era was proposed in 2012. The original 12 GeV beam delivery plan was for a maximum of three experimental halls at a time as in the 6 GeV era. Therefore, the new concept increases the potential beam time for the experiments up to 33%. This change required minimal modifications to the existing machine. The modifications were mainly timing and pattern changes to the beams in the injector, adding a fourth laser to the photo-cathode gun, and the addition of new RF separators to the highest pass of CEBAF. These changes are now all in place and, for the first time, the full system is operating, producing four simultaneous beams through the accelerator to four different destina-tions. In this paper, in addition to presenting the results of the full system commissioning, we will discuss im-portant details about the new configuration plus some of our operational challenges.

Kazimi, Reza↗

DOE OSTI2018

Magnetized Electron Source for JLEIC Electron Cooler

Bunched-beam electron cooling is a key feature of all proposed designs of the future electron-ion collider, and a requirement for achieving the specified collision luminosity. For the Jefferson Lab Electron Ion Collider (JLEIC), fast cooling of ion beams will be accomplished via so-called 'magnetized cooling' implemented using a recirculator ring that employs an energy recovery linac. In this contribution, we describe the production of magnetized electron beam using a compact 300 kV DC high voltage photogun with an inverted insulator geometry and alkali-antimonide photocathodes. Beam magnetization was assessed using a modest diagnostic beamline that includes YAG view screens for measuring the rotation angle of the electron beamlet passing through a narrow upstream slit. Magnetization characterization including drift emittance were measured for various gun bias voltages and laser spot sizes at the photocathode using 532 nm lasers with DC and RF time structure. With magnetized beam, photocathode lifetime at currents up to 28 mA CW was measured and high bunch charge up to 700 pC was demonstrated.

Mamun, Md Abdullah↗

DOE OSTI2015

Evaluation of electropolished stainless steel electrodes for use in DC high voltage photoelectron guns

DC high voltage photoelectron guns are used to produce polarized electron beams for accelerator-based nuclear and high-energy physics research. Low-level field emission (∼nA) from the cathode electrode degrades the vacuum within the photogun and reduces the photoelectron yield of the delicate GaAs-based photocathode used to produce the electron beams. High-level field emission (>μA) can cause significant damage the photogun. To minimize field emission, stainless steel electrodes are typically diamond-paste polished, a labor-intensive process often yielding field emission performance with a high degree of variability, sample to sample. As an alternative approach and as comparative study, the performance of electrodes electropolished by conventional commercially available methods is presented. Our observations indicate the electropolished electrodes exhibited less field emission upon the initial application of high voltage, but showed less improvement with gas conditioning compared to the diamond-paste polished electrodes. In contrast, the diamond-paste polished electrodes responded favorably to gas conditioning, and ultimately reached higher voltages and field strengths without field emission, compared to electrodes that were only electropolished. The best performing electrode was one that was both diamond-paste polished and electropolished, reaching a field strength of 18.7 MV/m while generating less than 100 pA of field emission. The authors speculate that the combined processes were the most effective at reducing both large and small scale topography. However, surface science evaluation indicates topography cannot be the only relevant parameter when it comes to predicting field emission performance.

42 ENGINEERING↗