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Harrington, Jim

Publications and source records attributed to Harrington, Jim.

Using expert systems to analyze ATE data

The proliferation of automatic test equipment (ATE) is resulting in the generation of large amounts of component data. Some of this component data is not accurate due to the presence of noise. Analyzing this data requires the use of new techniques. This paper describes the process of developing an expert system to analyze ATE data and provides an example rule in the CLIPS language for analyzing trip thresholds for high gain/high speed comparators.

Harrington, Jim

Attitude Determination and Control System (ADCS) and Maintenance and Diagnostic System (MDS): A maintenance and diagnostic system for Space Station Freedom

The Maintenance and Diagnostic System (MDS) that is being developed at Honeywell to enhance the Fault Detection Isolation and Recovery system (FDIR) for the Attitude Determination and Control System on Space Station Freedom is described. The MDS demonstrates ways that AI-based techniques can be used to improve the maintainability and safety of the Station by helping to resolve fault anomalies that cannot be fully determined by built-in-test, by providing predictive maintenance capabilities, and by providing expert maintenance assistance. The MDS will address the problems associated with reasoning about dynamic, continuous information versus only about static data, the concerns of porting software based on AI techniques to embedded targets, and the difficulties associated with real-time response. An initial prototype was built of the MDS. The prototype executes on Sun and IBM PS/2 hardware and is implemented in the Common Lisp; further work will evaluate its functionality and develop mechanisms to port the code to Ada.

Toms, David