Cosmological inference from an emulator based halo model. II. Joint analysis of galaxy-galaxy weak lensing and galaxy clustering from HSC-Y1 and SDSS
Here, we present high-fidelity cosmology results from a blinded joint analysis of galaxy-galaxy weak lensing (ΔΣ) and projected galaxy clustering (w p ) measured from the Hyper Suprime-Cam Year-1 (HSC-Y1) data and spectroscopic Sloan Digital Sky Survey (SDSS) galaxy catalogs in the redshift range 0.15 < z < 0.7. We define luminosity-limited samples of SDSS galaxies to serve as the tracers of w p in three spectroscopic redshift bins, and as the lens samples for ΔΣ. For the ΔΣ measurements, we select a single sample of 4×10 6 source galaxies over 140 deg 2 from HSC-Y1 with photometric redshifts (photo z) greater than 0.75, enabling a better handle of photo- z errors by comparing the ΔΣ amplitudes for the three lens redshift bins. The deep, high-quality HSC-Y1 data enable significant detections of the ΔΣ signals, with integrated signal-to-noise ratio S/N ~ 15 in the range 3 ≤ R/[h –1 Mpc] ≤ 30 for the three lens samples, despite the small area coverage. For cosmological parameter inference, we use an input galaxy-halo connection model built on the dark emulator package (which uses an ensemble set of high-resolution N-body simulations and enables fast, accurate computation of the clustering observables) with a halo occupation distribution that includes nuisance parameters to marginalize over modeling uncertainties. We model the ΔΣ and wp measurements on scales from R≃3 and 2h –1 Mpc , respectively, up to 30 h –1 Mpc (therefore excluding the baryon acoustic oscillations information) assuming a flat Λ CDM cosmology, marginalizing over about 20 nuisance parameters and demonstrating the robustness of our results to them. With various tests using mock catalogs described in Miyatake et al. [preceding paper, Phys. Rev. D 106, 083519 (2022)], we show that any bias in the clustering amplitude S 8 ≡ σ 8 (Ω m /0.3) 0.5 due to uncertainties in the galaxy-halo connection is less than ~ 50 % of the statistical uncertainty of S 8 , unless the assembly biaseffect is unexpectedly large. Our best-fit models have S 8 = 0.795$_{-0.042}^{+0.049}$ (mode and 68% credible interval) for the flat Λ CDM model; we find tighter constraints on the quantity S 8 (α = 0.17)≡σ 8 (Ω m /0.3) 0.17 = 0.745$_{-0.031}^{+0.039}$.