Randomized Linear and Compressed Gate Set Tomography
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Miller, Nathaniel Robert↗
Engineering topics
Hines, Jordan Hastings
Publications and source records attributed to Hines, Jordan Hastings.
Pauli Noise Learning for Mid-Circuit Measurements
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Hines, Jordan Hastings↗
Scalable Randomized Benchmarking with Mid-Circuit Measurements, Part 2
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Hines, Jordan Hastings↗
A Simple Statistical Model for Randomized Benchmarking Data
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Surti, Samyak Prasoon↗
Gate Set Tomography for Continuously Parameterized Gates
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Hines, Jordan Hastings↗
Randomized benchmarking into the quantum advantage regime
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Hines, Jordan Hastings↗