Engineering topics

Hitchcock, Adam

Publications and source records attributed to Hitchcock, Adam.

4 records

DOE OSTI2010

A new Scanning Transmission X-ray Microscope at the ALS for operation up to 2500eV

We report on the design and construction of a higher energy Scanning Transmission X-ray Microscope on a new bend magnet beam line at the Advanced Light Source. Previously we have operated such an instrument on a bend magnet for C, N and O 1s NEXAFS spectroscopy. The new instrument will have similar performance at higher energies up to and including the S 1s edge at 2472eV. A new microscope configuration is planned. A more open geometry will allow a fluorescence detector to count emitted photons from the front surface of the sample. There will be a capability for zone plate scanning in addition to the more conventional sample scanning mode. This will add the capability for imaging a massive sample at high resolution over a limited field of view, so that heavy reaction cells may be used to study processes in-situ, exploiting the longer photon attenuation length and the longer zone plate working distances available at higher photon energy. The energy range will extend down to include the C1s edge at 300eV, to allow high energy NEXAFS microscopic studies to correlate with the imaging of organics in the same sample region of interest.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

DOE OSTI2010

Phase Segregation in Polystyrene?Polylactide Blends

Spun-cast films of polystyrene (PS) blended with polylactide (PLA) were visualized and characterized using atomic force microscopy (AFM) and synchrotron-based X-ray photoemission electron microscopy (X-PEEM). The composition of the two polymers in these systems was determined by quantitative chemical analysis of near-edge X-ray absorption signals recorded with X-PEEM. The surface morphology depends on the ratio of the two components, the total polymer concentration, and the temperature of vacuum annealing. For most of the blends examined, PS is the continuous phase with PLA existing in discrete domains or segregated to the air?polymer interface. Phase segregation was improved with further annealing. A phase inversion occurred when films of a 40:60 PS:PLA blend (0.7 wt percent loading) were annealed above the glass transition temperature (Tg) of PLA.

36 MATERIALS SCIENCE↗

DOE OSTI2010

X-ray Spectromicroscopy Study of Protein Adsorption to a Polystyrene-Polylactide Blend

Synchrotron-based X-ray photoemission electron microscopy (X-PEEM) was used to study the adsorption of human serum albumin (HSA) to polystyrene-polylactide (40:60 PS-PLA, 0.7 wt percent) thin films, annealed under various conditions. The rugosity of the substrate varied from 35 to 90 nm, depending on the annealing conditions. However, the characteristics of the protein adsorption (amounts and phase preference) were not affected by the changes in topography. The adsorption was also not changed by the phase inversion which occured when the PS-PLA substrate was annealed above Tg of the PLA. The amount of protein adsorbed depended on whether adsorption took place from distilled water or phosphate buffered saline solution. These differences are interpreted as a result of ionic strength induced changes in the protein conformation in solution.

36 MATERIALS SCIENCE↗

NASA NTRS2003

Composition of the Chandra ACIS Contaminant

The Advanced CCD Imaging Spectrometer (ACIS) on the Chandra X-ray Observatory is suffering a gradual loss of low energy sensitivity due to a buildup of a contaminant. High resolution spectra of bright astrophysical sources using the Chandra Low Energy Transmission Grating Spectrometer (LETGS) have been analyzed in order to determine the nature of the contaminant by measuring the absorption edges. The dominant element in the contaminant is carbon. Edges due to oxygen and fluorine are also detectable. We can place stringent limits on nitrogen and high Z elements such as AI, Si, and Mg. Not including H, we find that C, O, and F comprise less than 80%, 7%, and 7% of the contaminant by number, respectively, Nitrogen is less than 3% of the contaminant. We will assess various candidates for the contaminating material and the time dependence. For example, the detailed structure of the absorption edges provides information about the bonding structure of the compound, eliminating aromatic hydrocarbons as the contaminating material.

Marshall, Herman↗