Engineering topics
Hoang, B.
Publications and source records attributed to Hoang, B..
Micrometeorite Impact Test of Flex Solar Array Coupon
Spacecraft with solar arrays operate throughout the near earth environment and are planned for outer planet missions. An often overlooked test condition for solar arrays that is applicable to these missions is micrometeoroid impacts and possibly electrostatic discharge (ESD) events resulting from these impacts. NASA Marshall Space Flight Center (MSFC) is partnering with Space Systems/Loral, LLC (SSL) to examine the results of simulated micrometeoroid impacts on the electrical performance of an advanced, lightweight flexible solar array design. The test is performed at MSFC's Micro Light Gas Gun Facility with SSL-provided coupons. Multiple impacts were induced at various locations on a powered test coupon under different string voltage (0V-150V) and string current (1.1A - 1.65A) conditions. The setup, checkout, and results from the impact testing are discussed.
Micrometeorite Impact Test of Flex Solar Array Coupon
Spacecraft with solar arrays operate throughout the near earth environment and are increasingly planned for outer planet missions. An often overlooked test condition for solar arrays that is applicable to these missions is micrometeorite impacts and possibly electrostatic discharge (ESD) events resulting from these impacts. The Marshall Space Flight Center (MSFC) is partnering with Space Systems/Loral, LLC (SSL) to examine the results of simulated micrometeorite impacts on the electrical performance of an advanced, lightweight flexible solar array design. The test is performed at NASA MSFC's Microlight Gas Gun Facility. The SSL-provided coupons consist of three strings, each string with two solar cells in series. Five impacts will be induced at various locations on a powered test coupon under different string voltage (0 volts - 150 volts) and string current (1.1 amperes - 1.65 amperes) conditions. The maximum specified test voltage and current represent margins of 1.5 times for both voltage and current. The test parameters are chosen to demonstrate new array design robustness to any ESD event caused by plasma plumes resulting from a simulated micrometeorite impact. A second unpowered coupon will undergo two impacts: one impact on the front side and one impact on the back side. Following the impact testing, the second coupon will be exposed to a thermal cycle test to determine possible damage propagation and further electrical degradation due to thermally-induced stress. The setup, checkout, and results from the impact testing are discussed. The challenges for impact testing include precise coupon alignment to control impact location; pressure management during the impact process; and measurement of the true transient electrical response during impact on the powered coupon. Results from pre- and post-test visual and electrical functional testing are also discussed.
High Current ESD Test of Advanced Triple Junction Solar Array Coupon
A test was conducted on an Advanced Triple Junction (ATJ) coupon that was part of a risk reduction effort in the development of a high-powered solar array design by SSL. The ATJ coupon was a small, 4-cell, two-string configuration that has served as the basic test coupon design used in previous SSL environmental aging campaigns. The coupon has many attributes of the flight design; e.g., substrate structure with graphite face sheets, integrated by-pass diodes, cell interconnects, RTV grout, wire routing, etc. The objective of the present test was to evaluate the performance of the coupon after being subjected to induced electrostatic discharge testing at two string voltages (100 V, 150 V) and four array current (1.65 A, 2.0 A, 2.475 A, and 3.3 A). An ESD test circuit, unique to SSL solar array design, was built that simulates the effect of missing cells and strings in a full solar panel with special primary arc flashover circuitry. A total of 73 primary arcs were obtained that included 7 temporary sustained arcs (TSA) events. The durations of the TSAs ranged from 50 μs to 2.9 ms. All TSAs occurred at a string voltage of 150 V. Post-test Large Area Pulsed Solar Simulator (LAPSS), Dark I-V, and By-Pass Diode tests showed that no degradation occurred due to the TSA events. In addition, the post-test insulation resistance measured was > 50 G-ohms between cells and substrate. These test results indicate a robust design for application to a high-current, high-power mission application.