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Engineering topics

Hoek, Eric M. V. (ORCID:0000000296741916)

Publications and source records attributed to Hoek, Eric M. V. (ORCID:0000000296741916).

1 records

All sources NASA NTRS DOE OSTI

DOE OSTI2024

Sample preparation matters: Scanning electron microscopic characterization of polymeric membranes

Not Available

Wu, Jishan↗