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Houck, W. H.

Publications and source records attributed to Houck, W. H..

5 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1974

Signal conditioner test set

A system was developed for testing components contained in a signal conditioning module with a transistor and capacitor included in a circuit. The system includes a housing with a socket into which the module to be tested is plugged. A test switch is provided for selectively connecting a variable load to either a transistor or capacitor in the circuit for testing the operation. A signal generating circuit is provided for generating signals for use in testing the components of the module.

Houck, W. H.↗
NASA NTRS1973

Signal conditioner test set

Compact, light-weight, solid-state test set can be used to check signal conditioning modules while they are installed in system. Test sets may also be used to cycle ground computer, if it is suspected of malfunctioning, rather than using signal conditioners.

Houck, W. H.↗
NASA NTRS1971

Electronic ripple indicator

Electronic circuit for monitoring excessive ripple voltage on dc power lines senses voltage variations from few millivolts to maximum of 10 volts rms. Instrument is used wherever power supply fluctuations might endanger system operations or damage equipment. Device is inexpensive and easily packaged in small chassis.

Davidson, J. K.↗
NASA NTRS1968

Circuit detects voltage decrease in computer power supply

Rapid-response monitoring circuit detects voltage decrease or dropout in any single phase or all three phases simultaneously of a 3-phase 60 Hz computer power supply. It uses lamps to indicate voltage conditions and provides a digital pulse output for a chronological record of voltage irregularities.

Houck, W. H.↗