Engineering topics

Howard, J. W.

Publications and source records attributed to Howard, J. W..

4 records

NASA NTRS2016

Natural Environments Definition for Design

Planning for future National Aeronautics and Space Administration (NASA) missions will encompass a variety of operational and engineering activities that involve a multitude of issues, constraints, and influences derived from the natural environment. This Technical Memorandum (TM) presents a definition of the natural environment, i.e., a description in engineering handbook format of models and data specifically selected to support the architecture development, engineering design, and technology development for NASA's Exploration Systems Development (ESD) initiatives.

Justh, H. L.↗

NASA NTRS2007

TID and SEE Response of an Advanced Samsung 4G NAND Flash Memory

Initial total ionizing dose (TID) and single event heavy ion test results are presented for an unhardened commercial flash memory, fabricated with 63 nm technology. Results are that the parts survive to a TID of nearly 200 krad (SiO2), with a tractable soft error rate of about 10(exp -l2) errors/bit-day, for the Adams Ten Percent Worst Case Environment.

Oldham, Timothy R.↗

NASA NTRS2006

Development of a Low-Cost and High-speed Single Event Effects Testers based on Reconfigurable Field Programmable Gate Arrays (FPGA)

A viewgraph presentation on the development of a low cost, high speed tester reconfigurable Field Programmable Gata Array (FPGA) is shown. The topics include: 1) Introduction; 2) Objectives; 3) Tester Descriptions; 4) Tester Validations and Demonstrations; 5) Future Work; and 6) Summary.

Howard, J. W.↗

NASA NTRS1990

A new method for using Cf-252 in SEU testing

A system using Cf-252 and associated nuclear instrumentation has determined the single-event upset (SEU) cross section versus linear energy transfer (LET) curve for several 2K x 8 static random access memories (SRAMs). The Cf-252 fission fragments pass through a thin-film organic scintillator detector (TFD) on the way to the device under test (DUT). The TFD provides energy information for each transiting fragment. Data analysis provides the energy of the individual ion responsible for each SEU; thus, separate upset cross sections can be developed for different energy and mass regions of the californium spectrum. This californium-based device is quite small and fits onto a bench top. It provides a convenient and inexpensive supplement or alternative to accelerator and high-altitude/space SEU testing.

Costantine, A.↗