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Howle, W. M., Jr.

Publications and source records attributed to Howle, W. M., Jr..

3 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1979

Information adaptive system of NEEDS

The NASA End-to-End Data System (NEEDS) program was initiated by NASA to improve significantly the state of the art in acquisition, processing, and distribution of space-acquired data for the mid-1980s and beyond. The information adaptive system (IAS) is a program element under NEEDS Phase II which addresses sensor specific processing on board the spacecraft. The IAS program is a logical first step toward smart sensors, and IAS developments - particularly the system components and key technology improvements - are applicable to future smart efforts. The paper describes the design goals and functional elements of the IAS. In addition, the schedule for IAS development and demonstration is discussed.

Howle, W. M., Jr.↗
NASA NTRS1978

Preliminary design for a standard 10 sup 7 bit Solid State Memory (SSM)

A modular concept with three separate modules roughly separating bubble domain technology, control logic technology, and power supply technology was employed. These modules were respectively the standard memory module (SMM), the data control unit (DCU), and power supply module (PSM). The storage medium was provided by bubble domain chips organized into memory cells. These cells and the circuitry for parallel data access to the cells make up the SMM. The DCU provides a flexible serial data interface to the SMM. The PSM provides adequate power to enable one DCU and one SMM to operate simultaneously at the maximum data rate. The SSM was designed to handle asynchronous data rates from dc to 1.024 Mbs with a bit error rate less than 1 error in 10 to the eight power bits. Two versions of the SSM, a serial data memory and a dual parallel data memory were specified using the standard modules. The SSM specification includes requirements for radiation hardness, temperature and mechanical environments, dc magnetic field emission and susceptibility, electromagnetic compatibility, and reliability.

Hayes, P. J.↗