Engineering topics

Huber, Martin C. E.

Publications and source records attributed to Huber, Martin C. E..

5 records

NASA NTRS1993

HiRES - High Resolution Extreme Ultraviolet Spectroheliometer toroidal diffraction grating performance evaluation

The ray-tracing results presented characterize the theoretically achievable EUV performance of the HiRES instrument. The effects of optical system misalignment on spectrograph images, and the laboratory results for two f/15 toroidal diffraction gratings that employ a multianode microchannel array, are also presented. Interferometric studies of toroidal figure accuracy, as well as optical and electron microscopy investigations of surface quality, are discussed. While the current toroidal gratings are noted to furnish good imaging across a wide wavelength range, they exhibit excessive EUV scatter, as well as spectral ghosting.

Berger, Thomas E.↗

NASA NTRS1992

Design and test of a High-Resolution EUV Spectroheliometer

The HiRES High-Resolution EUV Spectroheliometer is a sounding rocket instrument yielding very high spatial, spectral, and temporal resolution images of the solar outer atmosphere, on the basis of a 45-cm Gregorian telescope feeding a normal-incidence stigmatic EUV spectrometer with imaging multianode microchannel-array detector system, as well as an IR spectrometer with imaging CCD detector system. Attention is given to the expected performance of this system, including the effects of vibrational misalignments due to the sounding rocket flight environment.

Berger, Thomas E.↗

NASA NTRS1991

The fabrication of toroidal and coma-corrected toroidal diffraction gratings from spherical master gratings using elastically-deformable substrates - A progress report

A technique has been developed which permits toroidal, and coma-corrected toroidal, diffraction gratings to be replicated from spherical master gratings by the use of elastically-deformable substrates. Toroidal gratings correct for astigmatism and, thus, make it possible to construct stigmatic spectrometers that employ a single reflective diffraction grating. These spectrometers are particularly useful for the extreme-ultraviolet (EUV) wavelength range, where reflection coefficients are low, since the single optical surface provides for dispersion, focusing, and astigmatism correction. The fabrication procedures for the pure toroidal, and coma-corrected toroidal, gratings are described, and initial test results are presented. The use of the toroidal gratings in a high-resolution sounding-rocket EUV spectroheliometer, and in both the coronal diagnostics spectrometer and the ultraviolet coronagraph spectrometer on the ESA/NASA solar and heliospheric observatory mission, is described briefly, and the use of this technique for the fabrication of a coma-corrected toroidal grating for the prime Rowland spectrograph of the FUSE/Lyman mission is briefly discussed.

Huber, Martin C. E.↗

NASA NTRS1988

Absolute, Extreme-Ultraviolet, Solar Spectral Irradiance Monitor (AESSIM)

AESSIM, the Absolute, Extreme-Ultraviolet, Solar Spectral Irradiance Monitor, is designed to measure the absolute solar spectral irradiance at extreme-ultraviolet (EUV) wavelengths. The data are required for studies of the processes that occur in the earth's upper atmosphere and for predictions of atmospheric drag on space vehicles. AESSIM is comprised of sun-pointed spectrometers and newly-developed, secondary standards of spectral irradiance for the EUV. Use of the in-orbit standard sources will eliminate the uncertainties caused by changes in spectrometer efficiency that have plagued all previous measurements of the solar spectral EUV flux.

Huber, Martin C. E.↗

NASA NTRS1987

Absolute oscillator strengths for 108 lines of Si I between 163 and 410 nanometers

Measurements of neutral silicon oscillator strengths (f-values) obtained by absorption and emission techniques have been combined using the numerical procedure of Cardon et al. (1979) to produce 108 f-values for the Si I lines between 163 and 410 nm. Beam-foil-lifetime measurements were employed to determine the absolute scale. The present measurements have uncertainties of about 0.07 dex (+ or - 16 percent) at the 1-sigma level of confidence. Good agreement is obtained between the results and previous data. The data also provide upper limits for the f-values of 22 other lines and information on the lifetimes for 36 levels in Si I.

Smith, Peter L.↗