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Husmann, O. K.

Publications and source records attributed to Husmann, O. K..

Accelerated Alpha-s deterioration in a geostationary orbit

Between the Teflon substrate and the interference filter a 2 micron varnish layer was sandwiched in. The bending radius of the SSM, measured on a cone, decreased from about 13 mm to 6 mm prior to interference filter fracture, due to increased tensile strength of its substrate. These samples, and for comparison samples of the same make but without varnish and a conductive layer were included in the test. Additionally 2 Teflon FEP samples without the protective interference filter, one of them with a conductive layer, were tested. The sample substrate was 125 micron Teflon FEP, with vapor deposited silver reflector and a thin Inconel film for corrosion protection.

Husmann, O. K.↗

Multilayer porous ionizer Patent

Multilayer porous refractory metal ionizer design with thick, porous, large-grain substrates and thin, porous micron-grain substrates

Husmann, O. K.↗