Engineering topics
Idir, M
Publications and source records attributed to Idir, M.
Development of Partially-Coherent Wavefront Propagation Simulation Methods for 3rd and 4th Generation Synchrotron Radiation Sources.
Partially-coherent wavefront propagation calculations have proven to be feasible and very beneficial in the design of beamlines for 3rd and 4th generation Synchrotron Radiation (SR) sources. These types of calculations use the framework of classical electrodynamics for the description, on the same accuracy level, of the emission by relativistic electrons moving in magnetic fields of accelerators, and the propagation of the emitted radiation wavefronts through beamline optical elements. This enables accurate prediction of performance characteristics for beamlines exploiting high SR brightness and/or high spectral flux. Detailed analysis of radiation degree of coherence, offered by the partially-coherent wavefront propagation method, is of paramount importance for modern storage-ring based SR sources, which, thanks to extremely small sub-nanometer-level electron beam emittances, produce substantial portions of coherent flux in X-ray spectral range. We describe the general approach to partially-coherent SR wavefront propagation simulations and present examples of such simulations performed using 'Synchrotron Radiation Workshop' (SRW) code for the parameters of hard X-ray undulator based beamlines at the National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory. These examples illustrate general characteristics of partially-coherent undulator radiation beams in low-emittance SR sources, and demonstrate advantages of applying high-accuracy physical-optics simulations to the optimization and performance prediction of X-ray optical beamlines in these new sources.
Energy resolution of the CdTe-XPAD detector:calibration and potential for Laue diffractionmeasurements on protein crystals
The XPAD3S-CdTe, a CdTe photon-counting pixel array detector, has been used to measure the energy and the intensity of the white-beam diffraction from a lysozyme crystal. A method was developed to calibrate the detector in terms of energy, allowing incident photon energy measurement to high resolution (approximately 140 eV), opening up new possibilities in energy-resolved X-ray diffraction. In order to demonstrate this, Laue diffraction experiments were performed on the bending-magnet beamline METROLOGIE at Synchrotron SOLEIL. The X-ray energy spectra of diffracted spots were deduced from the indexed Laue patterns collected with an imaging-plate detector and then measured with both the XPAD3S-CdTe and the XPAD3S-Si, a silicon photon-counting pixel array detector. The predicted and measured energy of selected diffraction spots are in good agreement, demonstrating the reliability of the calibration method. These results open up the way to direct unit-cell parameter determination and the measurement of high-quality Laue data even at low resolution. Based on the success of these measurements, potential applications in X-ray diffraction opened up by this type of technology are discussed.
Quadriwave Lateral Shearing Interferometry in an Achromatic and Continuously Self-imaging Regime for Future X-ray Phase Imaging
We present in this Letter a type of quadriwave lateral shearing interferometer for x-ray phase imaging. This device is based on a phase chessboard, and we take advantage of the large spectrum of the source to produce interferograms with a propagation-invariant contrast. Such a grating has been created for hard x-ray interferometry and experimentally tested on a synchrotron beamline at Soleil.
X-ray optics simulation using Gaussian superposition technique
We present an efficient method to perform x-ray optics simulation with high or partially coherent x-ray sources using Gaussian superposition technique. In a previous paper, we have demonstrated that full characterization of optical systems, diffractive and geometric, is possible by using the Fresnel Gaussian Shape Invariant (FGSI) previously reported in the literature. The complex amplitude distribution in the object plane is represented by a linear superposition of complex Gaussians wavelets and then propagated through the optical system by means of the referred Gaussian invariant. This allows ray tracing through the optical system and at the same time allows calculating with high precision the complex wave-amplitude distribution at any plane of observation. This technique can be applied in a wide spectral range where the Fresnel diffraction integral applies including visible, x-rays, acoustic waves, etc. We describe the technique and include some computer simulations as illustrative examples for x-ray optical component. We show also that this method can be used to study partial or total coherence illumination problem.