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Islam, Zahir

Publications and source records attributed to Islam, Zahir.

Absence of a bulk signature of a charge density wave in hard x-ray measurements of UTe 2

The long-sought pair density wave (PDW) is an exotic phase of matter in which charge density wave (CDW) order is intertwined with the amplitude or phase of coexisting, superconducting order. Originally predicted to exist in copper-oxides, circumstantial evidence for PDW order now exists in a variety of materials. Recently, scanning tunneling microscopy (STM) studies have reported evidence for a three-component CDW at the surface of the heavy-fermion superconductor, UTe 2 , persisting below its superconducting transition temperature [Aishwarya et al., Nature 618, 928933 (2023); Gu et al., Nature 618, 921927 (2023); LaFleur et al., Nat. Commun. 15, 4456 (2024)]. Here, in this study, we use hard x-ray diffraction measurements on crystals of UTe 2 at 𝑇 = 1.9 and 12 K to search for a bulk signature of this CDW. Using STM measurements as a constraint, we calculate the expected locations of CDW superlattice peaks and sweep a large volume of reciprocal space in search of a signature. We fail to find any evidence for a CDW near any of the expected superlattice positions in many Brillouin zones. We estimate an upper bound on the CDW lattice distortion of 𝑢 max ≲ 4×10 −3 Å. Our results suggest that the CDW observed in STM is either purely electronic, somehow lacking a signature in the lattice, or is restricted to the material surface.

Kengle, Caitlin S.↗

Direct detection system for full-field nanoscale X-ray diffraction-contrast imaging

Recent developments in X-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field X-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films prove challenging due to available detection methods and incident X-ray flux at the sample. We present a direct detection method developed in conjunction with KAImaging which focuses on DFXM studies in the hard X-ray range of 10s of keV and above capable of approaching nanoscale resolution. Additionally, we compare this direct detection scheme with routinely used scintillator-based optical detection and achieve an order of magnitude improvement in exposure times allowing for imaging of weakly diffracting ordered systems.

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