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Jackman, R. W.

Publications and source records attributed to Jackman, R. W..

Contamination threats to critical surfaces from handling and storage practices.

Review of the procedures and results of a program designed to remove the threat of sources of molecular and particulate contamination of critical optical, electrical, and mechanical elements in spacecraft. The results of recent contamination-probing thermal-vacuum tests indicate that some of the materials and practices commonly used to protect critical surfaces from molecular or particulate contamination can themselves represent significant threats. These contamination sources include clean-room and clean-tent materials, gloves, tissues, and covering or packaging materials. Mass and infrared spectral analyses of these materials and the environments and instruments exposed to them show that the contaminants are mostly plasticizers, slip or antistatic agents, and binders used in the manufacture of these products. Products of particular threat include vinyl gloves, boots, clean-tent walls, and some polyethylene sheets and bags. Techniques for reducing these threats are discussed.

Poehlmann, H. C.↗