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Jeffrey I. Eldridge

Publications and source records attributed to Jeffrey I. Eldridge.

Transverse Strength of SCS-6 Silicon Carbide Fibers

A diametral compression test was used to measure the transverse strength of SCS-6 SiC fibers before and after heat treatment. Subjecting fibers to diametral compression successfully produced transverse tensile failure in the form of fiber cracking along the same diametral plane in which the compressive load was applied. An analysis of the hoop stress along the diametral plane, in which the effects of the C core were included, showed that there is a large tensile hoop stress concentration in the SiC sheath at the interface between the C core and the SiC sheath, where the stress is 6.3 times greater than the stress present in a solid SiC fiber under identical loading. This high tensile hoop stress concentration promotes crack initiation near the core and significantly limits the capability of these fibers to withstand transverse compressive loading. The maximum tensile hoop stresses, located at the interface between the C core and SiC sheath, at the measured failure loads were 850 MPa for the as-received SCS-6 fiber and 1210 MPa for fibers exposed to a 1-h heat treatment at 1850°C in 138 MPa of Ar.

Jeffrey I. Eldridge↗

Development of Luminescence Lifetime-Based Surface Temperature Mapping for Environmental Barrier Coatings

Luminescence lifetime-based temperature mapping for thermal barrier coatings (TBCs) has been previously demonstrated up to temperatures approaching 1200 °C. Advantages of this method include insensitivities to reflected radiation and emissivity uncertainties. Because of a push towards greater efficiency turbine engine operation using higher turbine inlet temperatures, there is an ongoing movement from TBC-coated superalloy turbine engine components to SiC/SiC ceramic matrix composite components protected by environmental barrier coatings (EBCs). The useful application of luminescence lifetime-based temperature mapping to EBCs requires a significant increase in high temperature capability from below 1200 °C up into the 1300 to 1500 °C temperature range where the much higher background thermal radiation is a challenging issue. In addition, the luminescing sensing layer must exhibit thermochemical compatibility with the EBC. To meet these requirements, Er-doped Y 2 SiO 5 was selected as the luminescing sensor layer material both for its enhanced temperature sensitivity above 1300 °C and its compatibility with rare-earth disilicate EBC topcoats. Both localized spot temperature measurements as well as luminescence lifetime imaging-based temperature mapping were demonstrated up to 1560 °C for Er-doped Y 2 SiO 5 disks. In addition, temperature mapping capability was demonstrated from a 15 µm thick Er-doped Y 2 SiO 5 layer at the surface of a Sc 2 Si 2 O 7 based EBC topcoat. Both localized spot and temperature mapping by luminescence lifetime imaging were demonstrated up to 1380 °C (upper temperature limit of this slurry-based layered EBC) with excellent suppression of background thermal radiation and no degradation of the Er-doped Y 2 SiO 5 temperature sensing surface layer. The source of the novel enhanced temperature sensitivity above 1300 °C will be discussed as well as a path towards compatibility between sensing layer and EBC topcoat to higher temperatures.

temperature measurement↗