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Jelinsky, Sharon

Publications and source records attributed to Jelinsky, Sharon.

Contamination control program results from three years of ground operations on the Extreme Ultraviolet Explorer instruments

A stringent contamination-control plan has been developed for the optical components of the Extreme Ultraviolet Explorer instruments, whose performance in the 80-900 A wavelength range is highly sensitive to particulate and molecular contamination. The contamination-control program has been implemented over the last three years during assembly, test and calibration phases of the instrument. These phases have now been completed and the optics cavities of the instruments have been sealed until deployment in space. Various approaches are discussed which have been used during ground operations to meet optics' contamination goals within the project schedule and budget. The measured optical properties of EUV witness mirrors are also presented which remained with the flight mirrors during ground operations. These were used to track optical degradation due to contamination from the cleanroom and high-vacuum test-chamber environments.

Ray, David C.↗

A comparison between measured surface microtopography and observed scattering in the extreme ultraviolet

The paper presents comparative measurements of surface roughness on prepared samples. These measurements have been made with both Talystep profilometers and WYKO interferometers. In addition, the scattering distribution from these samples was measured at extreme ultraviolet wavelengths. The utility of the WYKO interferometer and Talystep device for specifying extreme ultraviolet mirror surface quality is discussed.

Green, James↗

Low reflectance EUV materials - A comparative study

A study has been undertaken of the performance characteristics of a variety of surfaces and surface treatments for use on baffle materials in Extreme UV Explorer instrumentation, in order to ascertain which materials performed with the least overall scattering between 300 and 1200 A and thereby minimize this important background source. Seven scattering samples were measured: bead-blasted aluminum treated with alodine 600, bead-blasted aluminum, Kel-f, etched molybdenum, nickel-plated etched molybdenum, bead-blasted 304 stainless steel, and bead-blasted aluminum painted with Chemglaze Z-306. Attention is given to total reflectance of each material plotted against the graze angle for 304, 584, and 1216 A.

Jelinsky, Patrick↗

Contamination control approach for the Extreme Ultraviolet Explorer satellite instrumentation

The Extreme Ultraviolet Explorer will perform an all-sky survey and spectroscopic observations over the wavelength range 80-900A. Hydrocarbon and particulate contamination will potentially affect the throughput and signal to noise ratio of the signal detected by the instruments. A witness sample program is here used to investigate and monitor the effects of specific contaminants on EUV reflectivity. Witness samples were intentionally contaminated with thin layers of pump oil. An oil layer 150 A thick was applied and found to evaporate over 8 hours. The EUV reflectivity and imaging properties were then measured and found to be acceptable for grazing angles between 5 and 30 deg. In a second test, layers 500 A thick were deposited and then allowed to evaporate in vacuum; once the oil had evaporated to at least 350 A, the final sample reflectivity was degraded less than 10 percent, but the image was degraded severely by scattering. An outline of the contamination control program is also presented.

Mrowka, Stan↗