Engineering topics

Jellison, Jr., Gerald Earle

Publications and source records attributed to Jellison, Jr., Gerald Earle.

6 records

DOE OSTI2019

Crystallographic orientation of orthorhombic aragonite using reflection generalized ellipsometry

Here, the 2-modulator generalized ellipsometry microscope (2-MGEM) has been used to study a natural crystal of aragonite. Like its polymorph calcite, aragonite has a large refractive index difference between light polarized parallel to the c-axis and light polarized perpendicular to the c-axis. Unlike calcite, aragonite is orthorhombic, so there is also a very small difference between the refractive indices polarized along the a- and b-directions. As a result, it is not possible to use the 2-MGEM to obtain a definitive map of the optic axis directions of a sample as was possible with calcite, but it is possible to determine approximately the orientation of the c-axis with respect to the surface normal. If the c-axis is in the sample surface plane, it is possible to measure very small deviations of the c-axis direction with an accuracy of ~0.2°. If the c-axis is oriented normal to the sample surface, 2-MGEM data can be used to identify different crystallites due to rotations about the c-axis. For comparison, the orientations of some of the crystallites have also been measured using X-ray Laue and electron beam backscatter diffraction. In addition, spectroscopic generalized ellipsometry measurements have been used to determine the refractive indices of aragonite.

36 MATERIALS SCIENCE↗

DOE OSTI2018

Crystallographic orientation of uniaxial calcite and dolomite determined using reflection generalized ellipsometry

In this study, using the two-modulator generalized ellipsometry microscope (2-MGEM), it is shown that it is possible to determine the direction of the optic axis of crystallites of the high birefringence materials calcite and dolomite. 2-MGEM measurements are performed in reflection at near-normal incidence, so sample preparation requires only an optically polished surface. For uniaxial materials, the 2-MGEM measures the direction of the fast axis and the diattenuation, which can then be related to the tilt angle of the optic axis with respect to the surface normal once the maximum diattenuation is known. The optical resolution of the present instrument is 4-6 μm, and areas as large as 1 cm 2 can be measured without distortion. Additionally, the 2-MGEM measures the depolarization, which is a measure of the quality of the data. Using this information, an optical pole figure can be determined. The 2-MGEM results are compared with electron backscatter diffraction (EBSD) measurements on the same samples. Lastly, additional standard spectroscopic generalized ellipsometry measurements at a large angle of incidence were performed on single crystal calcite and dolomite to determine the spectroscopic ordinary and extraordinary refractive indices from 220 nm to 850 nm from which the maximum diattenuation can be determined.

36 MATERIALS SCIENCE↗

DOE OSTI2018

Controllable reductive method for synthesizing metal-containing particles

The invention is directed to a method for producing metal-containing particles, the method comprising subjecting an aqueous solution comprising a metal salt, E.sub.h, lowering reducing agent, pH adjusting agent, and water to conditions that maintain the E.sub.h value of the solution within the bounds of an E.sub.h-pH stability field corresponding to the composition of the metal-containing particles to be produced, and producing said metal-containing particles in said aqueous solution at a selected E.sub.h value within the bounds of said E.sub.h-pH stability field. The invention is also directed to the resulting metal-containing particles as well as devices in which they are incorporated.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

DOE OSTI2017

Improved lithium iodide neutron scintillator with Eu 2+ activation: The elimination of Suzuki-Phase precipitates

Monovalent alkali halides such as NaI, CsI, and LiI are widely used as inorganic scintillators for radiation detection due to their light yield, the capability for the growth of large single crystals, relatively low cost, and other favorable characteristics. These materials are frequently activated through the addition of small amounts (e.g., a few hundred ppm) of elements such as thallium - or sodium in the case of CsI. The monovalent alkali halide scintillators can also be activated with low concentrations of Eu 2+ , however Eu activation has previously not been widely employed due to the non-uniform segregation of the divalent Eu dopant that leads to the formation of unwanted phases during Bridgman or other solidification crystal-growth methods. Specifically, for Eu concentrations near and above ~0.5%, Suzuki Phase precipitates form in the course of the melt-growth process, and these Suzuki Phase particles scatter the scintillation light. This adversely affects the scintillator performance via reduction in the optical transmission of the material, and depending on the crystal thickness and precipitated-particle concentration, this reduction can occur up to the point of opacity. Here we describe a post-growth process for the removal of Suzuki Phase precipitates from single crystals of the neutron scintillator LiI activated with Eu 2+ at concentrations up to and in excess of 3 wt.%, and we correlate the resulting neutron-detection performance with the thermal processing methods used to remove the Suzuki Phase particles. Furthermore, the resulting improved scintillator properties using increased Eu activator levels are applicable to neutron imaging and active interrogation systems, and pulse-height gamma-ray spectroscopy rather than pulse-shape discrimination can be used to discriminate between gamma ray and neutron interaction events.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

DOE OSTI2015

Processing of insulators and semiconductors

A method is disclosed for processing an insulator material or a semiconductor material. The method includes pulsing a plasma lamp onto the material to diffuse a doping substance into the material, to activate the doping substance in the material or to metallize a large area region of the material. The method may further include pulsing a laser onto a selected region of the material to diffuse a doping substance into the material, to activate the doping substance in the material or to metallize a selected region of the material.

36 MATERIALS SCIENCE↗

DOE OSTI2015

High-dose neutron irradiation performance of dielectric mirrors

The study presents the high-dose behavior of dielectric mirrors specifically engineered for radiation-tolerance: alternating layers of Al 2 O 3 /SiO 2 and HfO 2 /SiO 2 were grown on sapphire substrates and exposed to neutron doses of 1 and 4 dpa at 458 10K in the High Flux Isotope Reactor (HFIR). In comparison to previously reported results, these higher doses of 1 and 4 dpa results in a drastic drop in optical reflectance, caused by a failure of the multilayer coating. HfO 2 /SiO 2 mirrors failed completely when exposed to 1 dpa, whereas the reflectance of Al 2 O 3 /SiO 2 mirrors reduced to 44%, eventually failing at 4 dpa. Transmission electron microscopy (TEM) observation of the Al 2 O 3 /SiO 2 specimens showed SiO 2 layer defects which increases size with irradiation dose. The typical size of each defect was 8 nm in 1 dpa and 42 nm in 4 dpa specimens. Buckling type delamination of the interface between the substrate and first layer was typically observed in both 1 and 4 dpa HfO 2 /SiO 2 specimens. Composition changes across the layers were measured in high resolution scanning-TEM mode using energy dispersive spectroscopy. A significant interdiffusion between the film layers was observed in Al 2 O 3 /SiO 2 mirror, though less evident in HfO 2 /SiO 2 system. Lastly, the ultimate goal of this work is the provide insight into the radiation-induced failure mechanisms of these mirrors.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗