Engineering topics
Jeong, Wonho
Publications and source records attributed to Jeong, Wonho.
Study of radiative heat transfer in Ångström- and nanometre-sized gaps
Radiative heat transfer in Ångström- and nanometre-sized gaps is of great interest because of both its technological importance and open questions regarding the physics of energy transfer in this regime. Here in this paper we report studies of radiative heat transfer in few Å to 5nm gap sizes, performed under ultrahigh vacuum conditions between a Au-coated probe featuring embedded nanoscale thermocouples and a heated planar Au substrate that were both subjected to various surface-cleaning procedures. By drawing on the apparent tunnelling barrier height as a signature of cleanliness, we found that upon systematically cleaning via a plasma or locally pushing the tip into the substrate by a few nanometres, the observed radiative conductances decreased from unexpectedly large values to extremely small ones—below the detection limit of our probe—as expected from our computational results. Our results show that it is possible to avoid the confounding effects of surface contamination and systematically study thermal radiation in Ångström- and nanometre-sized gaps.
Quantification of thermal and contact resistances of scanning thermal probes
Scanning thermal probes are widely used for imaging temperature fields with nanoscale resolution, for studying near-field radiative heat transport and for locally heating samples. In all these applications, it is critical to know the thermal resistance to heat flow within the probe and the thermal contact resistance between the probe and the sample. Here, we present an approach for quantifying the aforementioned thermal resistances using picowatt resolution heat flow calorimeters. The measured contact resistance is found to be in good agreement with classical predictions for thermal contact resistance. The techniques developed here are critical for quantitatively probing heat flows at the nanoscale.
Characterization of nanoscale temperature fields during electromigration of nanowires
Quantitative studies of nanoscale heat dissipation (Joule heating) are essential for advancing nano-science and technology. Joule heating is widely expected to play a critical role in accelerating electromigration induced device failure. However, limitations in quantitatively probing temperature fields—with nanoscale resolution—have hindered elucidation of the role of Joule heating in electromigration. In this work, we use ultra-high vacuum scanning thermal microscopy to directly quantify thermal fields in nanowires during electromigration. Our results unambiguously illustrate that electromigration begins at temperatures significantly lower than the melting temperature of gold. Further, we show that during electromigration voids predominantly accumulate at the cathode resulting in both local hot spots and asymmetric temperature distributions. These results provide novel insights into the microscopic details of hot spot evolution during electromigration and are expected to guide the design of reliable nanoscale functional devices.
Heat dissipation in atomic-scale junctions
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