Leveraging Afterglow in Scintillation detectors for Multi-Frame High-Speed Radiography
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Engineering topics
Publications and source records attributed to Jimenez, Edward Steven.
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In this study, we address the challenge of enhancing image quality and spatial resolution in computed tomography (CT) imaging by introducing simulation and fabrication of high aspect ratio, point-like transmission targets. Utilizing advanced electroplating techniques, traditionally employed in the fabrication of Through Substrate Via (TSV) interconnects for CMOS circuitry, we successfully embed copper targets within silicon substrates. This method allows us to create high-aspect-ratio features specifically designed for X-ray transmission targets, resulting in micro targets that exhibit a volume increase compared to conventional evaporated surface targets. Furthermore, we present simulation results of the X-ray spectrum generated by these targets, demonstrating their potential to significantly improve both image quality and spatial resolution in CT applications. Our findings suggest that leveraging advanced fabrication techniques can open new avenues for the development of enhanced imaging technologies in medical diagnostics and beyond.
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Afterglow in x-ray imaging for high-speed radiography is a constraint that limits imaging systems to low-light/fast decay screens which create poor data. Current approaches focus purely on using low-light yield screens with fast decay to avoid multiple exposure pileup due to afterglow. The goal of this work is to develop a statistical estimation approach to leverage afterglow to improve image quality thus allowing for higher quality imaging components to be used. This will allow for bright screens will slow decay to be used, and then a post-processing step applies the statistical estimation to separate each frame with superior signal compared to low-light/fast decay screens.
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