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Johnson, Martin

Publications and source records attributed to Johnson, Martin.

Determination of an Optimal Commercial Data Bus Architecture for a Flight Data System

NASA/Marshall Space Flight Center (MSFC) is continually looking for methods to reduce cost and schedule while keeping the quality of work high. MSFC is NASA's lead center for space transportation and microgravity research. When supporting NASA's programs several decisions concerning the avionics system must be made. Usually many trade studies must be conducted to determine the best ways to meet the customer's requirements. When deciding the flight data system, one of the first trade studies normally conducted is the determination of the data bus architecture. The schedule, cost, reliability, and environments are some of the factors that are reviewed in the determination of the data bus architecture. Based on the studies, the data bus architecture could result in a proprietary data bus or a commercial data bus. The cost factor usually removes the proprietary data bus from consideration. The commercial data bus's range from Versa Module Eurocard (VME) to Compact PCI to STD 32 to PC 104. If cost, schedule and size are prime factors, VME is usually not considered. If the prime factors are cost, schedule, and size then Compact PCI, STD 32 and PC104 are the choices for the data bus architecture. MSFC's center director has funded a study from his discretionary fund to determine an optimal low cost commercial data bus architecture. The goal of the study is to functionally and environmentally test Compact PCI, STD 32 and PC 104 data bus architectures. This paper will summarize the results of the data bus architecture study.

Crawford, Kevin↗

Ampoule failure sensor development for semiconductor crystal growth experiments

Currently there are no devices to detect an ampoule failure in semiconductor crystal growth experiments. If an ampoule fails, it will go undetected until the containing cartridge is breached due to chemical degradation. The experiment will then be terminated resulting in a failed experiment and a loss of data. The objective of this research was to develop a reliable failure sensor that would detect a specific liquid or vapor material before the metallic cartridge is degraded and the processing furnace contaminated. The sensor is a chemical fuse made from a metal with which the semiconductor material reacts more rapidly than it does with the containing cartridge. Upon ampoule failure, the sensor is exposed to the vapor or liquid semiconductor and the chemical reaction causes a resistance change in the sensor material. The sensor shows a step change in resistance on the order of megohms when exposed to mercury zinc telluride (HgZnTe), mercury cadmium telluride (HgCdTe), or gallium arsenide (GaAs). This ampoule failure sensor is being tested for possible use on the second United States Microgravity Mission (USML-2) and is the subject of a NASA patent application.

CHEMICAL FUSE↗