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Jong Yoon Ha

Publications and source records attributed to Jong Yoon Ha.

The Impact of Transition-Edge Sensor Design on Internal Thermal Fluctuation Noise and Thermal Conductance

The measured noise in transition-edge sensor (TES) microcalorimeters with a Mo/Au bilayer has been shown to have a significant contribution from internal thermal fluctuation noise (ITFN) between the absorber and the TES. Previous measurements showed the relevant thermal link leading to the noise was the thermal conductance of the TES bilayer, and ITFN has been shown to correlate with the sheet resistance of the TES. As a result, ITFN is particularly significant in devices with a large bilayer sheet resistance. However, because of more favorable transition shapes, such high resistance devices have recently been shown to be preferable under alternating current bias, which is required for the frequency division multiplexed readout baselined for the X-ray Integral Field Unit (X-IFU) instrument on the ATHENA satellite. Therefore, it is important to investigate how else to minimize the ITFN beyond changes to the sheet resistance. In this presentation, we will discuss our investigation of how changes to the TES design can affect ITFN for a fixed sheet resistance. We will present how ITFN is altered by changes to the aspect ratio of the TES, the addition of normal metal banks parallel to the TES current direction, and the size and position of the connections between the absorber and the TES. We will also discuss how these design changes impact the superconducting transition shape, and the thermal conductance from the TES to the thermal bath. These results may provide routes for further improvements of TES performance, and a deeper understanding of the physics of the thermal network in a TES microcalorimeter.

Nicholas A Wakeham↗

Microcalorimeter Absorber Optimization for 0.2 to 12 keV X-Rays

The Advanced Telescope for High ENergy Astrophysics (ATHENA) mission requires high quantum efficiency (QE) x-ray absorption, >90.6% at 7 keV and low specific heat capacity, 0.731 pJ/K. The designed ATHENA x-ray absorbers are cantilevered square tiles (pitch of 317 microns) of 1.05 μm thick Au and 5.51 μm thick Bi electroplated films supported by stems that connect the absorber to the detector below. We discuss some of the methods used to produce x-ray absorbers meeting these specifications for ATHENA. To tune the thermal conductance of the device and the effect on the normal-to superconducting transition shape, the stems need to be small diameter and can have a weak bottle-neck connection to the substrate. A funnel shape of the stem using a proximity exposed photoresist mold has been developed to improve the strength of the connections. Further requirements on the absorbers include low levels of fine particulate remaining on the substrate after production and zero shorts between absorbers due to incomplete ion milling or trapped fine particular between absorbers. To optimize for post patterning substrate cleanliness and absorber yield, we have examined several methods of absorber fabrication. Three such methods are 1) an ion mill/wet etch combination, 2) a photoresist mold for electroplating followed by wet or dry etch to remove the seed layer, and 3) an electroplating process with leveling to smooth the surface followed by ion mill to separate the absorbers. The different combinations of wet and dry etches lead to different yields and surface appearance of the absorber sidewalls. We present results on the achieved pixel yields and the energy resolution of pixels made with the various fabrication methods. We discuss the impact of absorber patterning method on performance, uniformity, and yield.

Edward J Wassell↗

Long Term Performance Stability of TES Detectors

We are developing superconducting transition-edge sensor (TES) microcalorimeter arrays for a variety of applications such as ground-based laboratory astrophysics experiments and next generation space-based X-ray missions. These detectors can provide X-ray spectral information with an unprecedent resolution of ~2 eV at 6 keV and have been selected for the X-ray Integral Field Unit (X-IFU) instrument of ESA’s large flagship mission Athena. To maintain detector performance over the lifetime of the mission, it is important to understand whether environmental conditions that the detector may be exposed to will affect its properties over time. This “aging” begins right after the array leaves the fabrication environment, with potential exposure to humidity, oxygen, or elevated temperatures which may affect the detector performance. In a few prior arrays we have observed increased fall times in the pulse shape and/or the introduction of anomalous low energy tails on the X-ray spectrum. This is thought to be an indication of “aging” on chips exposed to such conditions, causing e.g. changes in the absorber properties. In this contribution, we report on a systematic characterization of TES properties, before and after exposing the chip to various controlled temperature and humidity levels and assess the changes in the measured transition and pulse shapes, energy resolution, and spectral redistribution.

S Beaumont↗