Engineering topics

Kahnt, Maik

Publications and source records attributed to Kahnt, Maik.

3 records

DOE OSTI2025

Ptychographic reconstructions performed in real time and offline have equivalent quality

Abstract Ptychography is a burgeoning imaging technique that enables high-resolution, lensless reconstruction of complex samples by analysing overlapping diffraction patterns, making it invaluable in fields like materials science, biology, and nanotechnology. Real-time ptychographic reconstructions are gaining interest in the scientific community as they provide immediate feedback. Yet their potential to replace offline reconstructions remains uncertain, in part due to questions about the quality of the resulting images. This study quantitatively compares real-time and offline reconstructions at different overlap conditions. Offline reconstructions, using all diffraction patterns at once, and real-time reconstructions, where new frames are added to the reconstructions in small chunks as the diffraction patterns are recorded, were indistinguishable and identical in reconstruction quality. These results hold consistently across all tested overlap ratios. This study represents the first quantitative analysis of real-time ptychographic reconstruction using a growing dataset, demonstrating the potential for real-time reconstructions to replace or at least complement offline reconstructions.

Science & Technology - Other Topics↗

DOE OSTI2022

Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples

Imaging large areas of a sample non-destructively and with high resolution is of great interest for both science and industry. For scanning coherent X-ray diffraction microscopy, i. e., ptychography, the achievable scan area at a given spatial resolution is limited by the coherent photon flux of modern X-ray sources. Multibeam X-ray ptychography can improve the scanning speed by scanning the sample with several parallel mutually incoherent beams, e. g., generated by illuminating multiple focusing optics in parallel by a partially coherent beam. The main difficulty with this scheme is the robust separation of the superimposed signals from the different beams, especially when the beams and the illuminated sample areas are quite similar. We overcome this difficulty by encoding each of the probing beams with its own X-ray phase plate. This helps the algorithm to robustly reconstruct the multibeam data. We compare the coded multibeam scans to uncoded multibeam and single beam scans, demonstrating the enhanced performance on a microchip sample with regular and repeating structures.

47 OTHER INSTRUMENTATION↗

DOE OSTI2021

The nanoscale distribution of copper and its influence on charge collection in CdTe solar cells

For decades, Cu has been the primary dopant in CdTe photovoltaic absorbers. Typically, Cu acceptor concentrations in these devices are on the order of 1 1014 cm-3, which has made it notoriously difficult to directly correlate nanoscale Cu distributions to the local charge transport properties of these devices. To measure and correlate these properties, measurement techniques require high sensitivity to elemental concentration, large penetration depth, and operando compatibility. Techniques such as secondary-ion mass spectroscopy and X-ray energy dispersive spectroscopy are widely adopted to measure Cu concentrations, but they are limited by penetration depth, sensitivity, or spatial resolution. Additionally, they lack the operando capabilities required to correlate one-to-one Cu concentrations to electrical performance. In this work, correlative X-ray microscopy is used to investigate the spatial distribution of Cu and its impact on charge collection through the depth and breadth of CdTe photovoltaic devices. Plan-view, nanoscale X-ray fluorescence maps clearly demonstrate the spatial segregation of copper around regions thought to be CdTe grain boundaries. Complementary cross-section imaging unveils the transition of the maximum charge-collection efficiency from the ZnTe-CdTe interface to the CdS-CdTe interface as a function of Cu incorporation. The copper concentration through the depth of the CdTe layer is characterized by slow and fast diffusion components, and cross-section charge-transport modeling shows that the experimentally obtained charge collection can be explained by the modeled acceptor distribution through the depth of the CdTe layer.

14 SOLAR ENERGY↗