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Kaplan, Herbert

Publications and source records attributed to Kaplan, Herbert.

Infrared thermal imaging figures of merit

Commercially available types of infrared thermal imaging instruments, both viewers (qualitative) and imagers (quantitative) are discussed. The various scanning methods by which thermal images (thermograms) are generated will be reviewed. The performance parameters (figures of merit) that define the quality of performance of infrared radiation thermometers will be introduced. A discussion of how these parameters are extended and adapted to define the performance of thermal imaging instruments will be provided. Finally, the significance of each of the key performance parameters of thermal imaging instruments will be reviewed and procedures currently used for testing to verify performance will be outlined.

Kaplan, Herbert

An update of commercial infrared sensing and imaging instruments

A classification of infrared sensing instruments by type and application, listing commercially available instruments, from single point thermal probes to on-line control sensors, to high speed, high resolution imaging systems is given. A review of performance specifications follows, along with a discussion of typical thermographic display approaches utilized by various imager manufacturers. An update report on new instruments, new display techniques and newly introduced features of existing instruments is given.

Kaplan, Herbert

NCTM workshop splinter session, IR thermal measurement instruments

The splinter session dealing with commercial industrial thermal measurement state-of-the-hardware had a total attendance of 15. Two papers were presented in the splinter session as follows: (1) Development of an Infrared Imaging System for the Surface Tension Driven Convection Experiment, Alexander D. Pline, NASA LeRC; (2) A Space-qualified PtSi Thermal Imaging System, Robert W. Astheimer, Barnes Engineering Div., EDO Corp. In addition a brief description of SPRITE detector technology was presented by Richard F. Leftwich of Magnovox. As anticipated, the discussions were concerned mainly with thermal imaging figures of merit rather than those for point measurement instruments. The need for uniform guidelines whereby infrared thermal imaging instruments could be specified and evaluated was identified as most important, particularly where temperature measurements are required. Presently there are differences in the way different manufacturers present significant performance parameters in their instrument data sheets. Furthermore, the prospective user has difficulty relating these parameters to actual measurement needs, and procedures by which performance can be verified are poorly defined. The current availability of powerful thermal imaging diagnostic software was discussed.

Kaplan, Herbert