Engineering topics
Publications and source records attributed to Kempe, Michael.
This open-source tool functions for calculating degradation of photovoltaic modules. For example, functions to calculate front and rear relative Humidity, as well as Acceleration Factors. A degradation calculation function is also being developed, considering humidity and spectral irradiances models.
Studies of metallization corrosion m photovoltaics have mainly been limited to comparisons of modules placed in accelerated chambers to fielded modules [1]. Damp Heat accelerated tests and phenomenological equations [2] are used to assess metallization corrosion without understanding the effect of UV light and temperature and humidity cycles on encapsulant adhesion degradation. The roles of encapsulant in-and out-diffusions of moisture and encapsulant impurities are important. Furthermore, few photovoltaic metallization corrosion studies included the role of bias and leakage currents, which are crucial in the electrochemical reaction of metallization. Leakage currents can highly accelerate the corrosion mechanism and are important to include in the studies of corrosion. In our research plan, we will address the following gaps in the PV community's understanding of metallization corrosion: (1) metallization corrosion with bias, humidity, and impurities in the encapsulant or metallization; (2) humidity diffusion through fresh and degraded encapsulants; and (3) comparison of model predictions with outdoor field modules and SunPower's extensive data for its back-contact and front-contact fleets [2] along with NREL's store of >20 year old modules. Our goal is to build models and accelerated tests to predict long term degradation of metallization corrosion of photovoltaic modules in the field. Our studies will include metals used in c-Si solar cells (Cu, Ag, and Al) and commonly used encapsulants (EV A (ethylene vinyl acetate), TPO (thermoplastic olefin), and silicone).
Backsheet cracking is among the most commonly observed degradation modes of photovoltaic modules in the field. Cracks can reduce the ability of backsheets to fulfill their functions, such as protection of the modules from the environment or electrical insulation. Here, this work presents an evaluation of the degradation and cracking propensity of two backsheets during accelerated IEC TS 62788-7-2 (International Electrotechnical Commission) aging under the A3 condition with a fragmentation test using a coextruded polyamide backsheet (AAA), and a laminated multilayer backsheet with a polyethylene terephthalate core and outer layer and ethylene vinyl acetate inner layer (PPE). Results show the surface embrittlement of the AAA outer layer during exposure. A longer time of exposure causes cracks to form at lower strains during stretching and creates deeper cracks. Accordingly, Young's modulus of the outer layer increases, as measured by cross-sectional nanoindentation. PPE exhibits cracking after exposure as well. While no similar increase of modulus or crack depth can be observed, the outer layer of PPE exhibits more obvious signs of erosion during exposure, including progressive morphological changes and thickness losses. A finite element model is developed to simulate surface crack formation, based on initially zero-thickness decohesion elements. Decohesion criteria define a critical stress, at which these elements grow, and cracks can begin to form. These criteria are obtained via parameter optimization by comparison between simulation and experiment. The model is used to interpret crack formation in both backsheets.
Abstract This paper analyzes the mechanisms and pathways for leakage current flow observed in Si photovoltaic modules subjected to high temperature and humidity and a large voltage bias with respect to ground. The current inside of the frame is in the form of electron motion, but in the glass and polymer, it is in at least a large part attributable to the movement of ions. When the mode of current flow changes from electronic to ionic conduction, electrochemical reactions will take place at the interface. This can include reactions that produce volatile chemical species like H 2 , CO x , and O 2 , along with ionic species such as OH − and H 3 O + . Here, we see evidence of the importance of different charge carriers with different diffusion rates and the influence of electrochemical processes involved. The application of negative voltage to the cell circuit affects the resistivity of glass producing surfaces with poor conductivity but with some increases in the electrochemical potential producing complicated interactions that are important when the voltage is changed. In the polymer, there is the development of a space charge region and a chemical gradient providing two oppositional forces to current flow, which when released create a complicated discharge process. Here, we give a basic understanding of the charge/discharge of PV cells highlighting how the specific mechanisms are important in understanding some of the degradation processes in PV modules. We find that there is evidence of multiple significant charge carrier species with different diffusion time scales. The glass/polymer interface forms a depleted region of higher resistance after prolonged exposure to current. Charge also builds up at the polymer to cell antireflective coating interface and mostly flows to the gridlines to experience electrochemical reactions. These complexities result in non‐linear behavior where the apparent resistivities of the different layers change during charge/discharging processes, making the modeling of the current flow extremely difficult.
In this study, we highlight some important factors in the specimen preparation methods for evaluating photovoltaic backsheet properties after accelerated aging. Two different sequences are considered: Method (I) cut-then-age: cut into 1-cm wide strips and then expose to stress, and Method (II) age-then-cut: expose a larger sheet to stress and then cut into 1-cm widths for mechanical property measurements. We also compare the effect of three cutting methods, (a) tensile specimen punch, (b) paper cutter, and (c) fresh razor blade. Several commercial backsheets were evaluated, with stress exposures including (a) pressure cooker test (PCT), (b) dry ultraviolet (UV) radiation exposure, and (c) UV combined damp heat tests. Fourier transform infrared spectrometer (FTIR) and intrinsic viscosity (IV) were used to analyze the materials on unstressed materials and samples exposed to PCT. The results show that both the cutting method and the time of cutting have an impact on the backsheet mechanical properties. Additionally, under UV exposure, Method II, age-then-cut, generally resulted in a higher average value, with more variation than Method I; however, if the side strips from Method II were excluded, the variation dropped to the same level. This is because the specimens at the sides of the sheet get additional damage from UV light from the exposed sides of the sample. In contrast to UV exposure, PCT specimens prepared by Method II result in lower average values and higher variability. This is attributed to embrittlement through the bulk of the sample where the cutting of embrittled specimens appears to result in more edge defects which can then initiate a break at smaller strains. The data suggest that for UV exposures, the specimens should be cut after aging and the exposed side specimens discarded, and that for PCT exposures, the specimens should be cut before the exposure.
Recycling is an important circular economy strategy, and for photovoltaics (PV), the one that has received the greatest research attention. Recycling of PV modules is required in Europe; everywhere else it competes in the market of end-of-life options, where cost is a primary decision factor. The vast majority of PV modules sold globally are crystalline-silicon (c-Si); most of the rest of the market are cadmium telluride thin film modules whose primary manufacturer runs its own commercial-scale recycling program. While many different c-Si recycling approaches and technologies have been proposed, they generally lack accompanying cost estimates or enough process information to model costs. Herein we develop detailed estimates of seven categories of capital and operating costs along with estimates of revenue from recovered materials for each step in two proposed recycling processes for c-Si PV modules. Using these results, we develop a hypothetical third recycling process merging process steps from the original two, estimate surcharges required to achieve minimum sustainable prices for each recycling process, as well as consider how economies of scale could reduce costs. Increasing the purity of and identifying higher-value markets for recovered materials are approaches to reducing costs and increasing recycling rates in voluntary markets.
Photovoltaic module degradation from a high system voltage is a prevalent degradation mode in the field, where the enabling degradation mechanisms are inherently dependent on the voltage bias polarity of the installed system. In this study, the effects of positive bias on module performance are confirmed and the underlying chemical degradation processes are more thoroughly investigated to reveal different degradation pathways from those previously reported in negative bias studies. When cells are under +1000 V stress, crystalline silicon mini-modules with poly(ethylene-co-vinyl acetate) (EVA) encapsulant demonstrated a significant photocurrent loss due to EVA discoloration and delamination from increased chemical reactivity at the front-side EVA/cell metallization interface. Brown discoloration of the EVA encapsulant near the cell gridlines is linked to an electrochemical reaction at the Ag gridlines under hot and humid conditions (85 °C, 85% relative humidity). Chemical compositional analysis using X-ray photoelectron spectroscopy (XPS) confirmed that the discoloration is attributed to the formation of silver sulfide (Ag 2 S) and/or silver oxide (Ag 2 O) species at the EVA/Ag gridline interface. The subsequent migration of Ag ions from the cell gridlines into the bulk of the EVA was evident from XPS depth profiling and optical microscopy. However, the Ag signal was not detected at the EVA/glass interface, inferring limited ionic transport through the nominally 0.45 mm thick encapsulant. For the samples studied herein, the sulfur is believed by the process of elimination to come from the ambient air, diffusing into the module through the permeable polymer backsheet.
Large-scale deployment of photovoltaic (PV) modules has considerably increased in recent decades. Given an estimated lifetime of 30 years, the challenge of how to handle large volumes of end-of-life PV modules is starting to emerge. In this Perspective, we assess the global status of practice and knowledge for end-of-life management for crystalline silicon PV modules. We focus in particular on module recycling, a key aspect in the circular economy of photovoltaic panels. We recommend research and development to reduce recycling costs and environmental impacts compared to disposal while maximizing material recovery. We suggest that the recovery of high-value silicon is more advantageous than the recovery of intact silicon wafers. This approach requires the identification of contaminants and the design of purification processes for recovered silicon. The environmental and economic impacts of recycling practices should be explored with techno–economic analyses and life-cycle assessments to optimize solutions and minimize trade-offs. As photovoltaic technology advances rapidly, it is important for the recycling industry to plan adaptable recycling infrastructure.
Backsheet cracking has been a major issue observed in the field; however, standardized qualification tests, such as IEC61215, are inadequate to reliably identify such failures of PV modules due to the lack of the critical weathering factors applied sequentially or in combination, such as those found in the service environments. To address this problem, in this work we investigated the effects of various environmental variables on the degradation and failure behaviors of the polyamide-based backsheet in PV modules retrieved from five different locations, encompassing a variety of climates, including humid subtropical, hot-summer Mediterranean, tropical savanna climate and hot arid. The correlations between the degradation indicators and the weathering variables were further demonstrated by principle components analysis (PCA). We found strong relationships between: carbonyl formation and reflected solar radiation; hydroxyl formation and module temperature; yellowness and NO2 concentration, while no simple correlation could be found between a specific weathering factor and cracking. By introducing additional stress factors to the aged polyamide-based backsheet films with the novel 'fragmentation test', we successfully reproduced the field cracking behaviour. This study has demonstrated that different degradation modes of PV components respond differently to the environmental stresses encountered in service. Thereby, any accelerated laboratory test based on a single set condition or lacking key environmental variables would be inadequate to assess the long-term performance of PV modules and components. A new reliability-based methodology is proposed to quantitatively link laboratory testing with field results for the service life prediction of PV materials.
Our objective is to develop for backsheets a predictive tests and a model based on point-in-time data from analytical techniques and datastreams that are applicable to both outdoor and indoor PV module backsheet studies and are supplemented with meteorology data, climatic and brand/model, and other accessible information. The predictive tests and models will specify indoor and outdoor exposure and evaluation data acquisition criteria, variable selection, and temporal duration and variation so as to be able to predict backsheet performance in various climatic zones. This backsheet performance prediction is based on defined backsheet failures in the field, and is quantified by tracking backsheet degradation in the field so as to determine degradation rates.
This paper analyzes the mechanisms for corrosion and delamination observed in Si photovoltaic modules subjected to high temperature and humidity with a negative-ground bias testing. Based on the thermodynamic data, the ionic component of the leakage current causes reduction reactions of water on the cathodic metallization, producing hydrogen gas and hydroxide ions. Ag fingers are strong catalysts for this reduction reaction compared to other materials used in solar cells and can be the initiation sites of corrosion and delamination caused by the electrochemical reactions. The produced hydrogen gas accumulates inside the module potentially producing a high gas pressure that can promote delamination, which is often preferentially initiated on metallization where the adhesion strength is lower [1], [2], [3]. The local basicity near the metal surface increases due to the hydroxide ion generation. Thus, the environment inside the encapsulant can be alkaline despite the presence of acetic acid decomposition products from the encapsulant. Corrosion of materials such as Si used in solar cells occurs and the extent depends on their corrosion resistance to the alkaline solution. This suggests that corrosion and delamination are interactive and promote the formation and propagation of one another.
There are relatively few field studies on the degradation of non-fluoropolymer-based backsheets, and understanding their in-field behavior is critical for further development of such products. In this paper, backsheet degradation of modules with one of these new types of backsheets (polyethylene naphthalate (PEN)-based) was documented at a four-year old utility-scale array located in Maryland (USA). Visual inspection, colorimetry, glossimetry, and Fourier-transform infrared spectroscopy (FTIR) revealed highly varied properties depending on module position within the array. Specifically, modules near the edge of the array and with higher mounting elevations underwent greater amounts of backsheet degradation, as indicated by yellowing and gloss-loss. The reason for these unique degradation patterns were differential backside exposure conditions, especially of ultraviolet light. This was strongly influenced by the array design, including array structural and environmental factors, such as module spacing and ground cover, respectively. Within the array, no clear link between backsheet degradation and module output or safety has been identified. However, such a relationship may be expected to become more pronounced with time, affecting system lifetime and ultimately the levelized cost of electricity (LCOE). Finally, the observed phenomena have implications for both backsheet product development and array design, especially for modules that utilize newer classes of non-fluoropolymer-based backsheets which are typically more susceptible to environmental degradation.
A progression of potential-induced degradation (PID) mechanisms are observed in CdTe modules, including shunting/junction degradation and two different manifestations of series resistance depending on the stress level and water ingress. The dark I-V method for in-situ characterization of Pmax based on superposition was adapted for the thin-film modules undergoing PID in view of the degradation mechanisms observed. An exponential model based on module temperature and relative humidity was fit to the PID rate for multiple stress levels in chamber tests and validated by predicting the observed degradation of the module type in the field.
Many photovoltaic (PV) technologies have been found to be sensitive to moisture that diffuses into a PV package. Even with the use of impermeable frontsheets and backsheets, moisture can penetrate from the edges of a module. To limit this moisture ingress pathway from occurring, manufacturers often use a low permeability polyisobutylene (PIB) based edge seal filled with desiccant to further restrict moisture ingress. Moisture ingress studies have shown that these materials are capable of blocking moisture for the 25-year life of a module; but to do so, they must remain well-adhered and free of cracks. This work focuses on adapting the Boeing Wedge test for use with edge seals laminated using glass substrates as part of a strategy to assess the long-term durability of edge seals. The advantage of this method is that it duplicates the residual stresses and strains that a glass/glass module may have when the lamination process results in some residual glass bending that puts the perimeter in tension. Additionally, this method allows one to simultaneously expose the material to thermal stress, humidity, mechanical stress, and ultraviolet radiation. The disadvantage of this method generally is that we are limited by the fracture toughness of the glass substrates that the edge seal is adhered to. However, the low toughness of typical uncrosslinked or sparsely crosslinked PIB makes them suitable for this technique. We present data obtained during the development of the wedge test for use with PV edge seal materials. This includes development of the measuring techniques and evaluation of the test method with relevant materials. We find consistent data within a given experiment, along with the theoretical independence of fracture toughness measurements with wedge thickness. This indicates that the test methodology is reproducible. However, even though individual experimental sets are consistent, the reproducibility between experimental sets is poor. We believe this may be due to inconsistencies in sample history, sample batch, or small changes in sample preparation/assembly from one month to the next. Because the fracture strength of typical edge seal materials is so low, they cannot be relied upon for mechanical strength. A small stress or strain on the edge seal is capable of promoting delamination or tearing causing the edge seal to fail. Because of this, edge seals are very dependent on the processing and construction parameters in the full size PV module such that any long term evaluation of their durability must be conducted on full size modules to be accurate.
Reduced strength of attachment of the encapsulant resulting from the outdoor environment, including ultraviolet (UV) radiation, may decrease photovoltaic (PV) module lifetime by enabling widespread corrosion of internal components. To date, few studies exist showing how the adhesion of PV components varies with environmental stress. We have conducted an interlaboratory experiment to provide an understanding that will be used to develop climatic specific module tests. Factors examined in the study included the UV light source (lamp type), temperature, and humidity to be proposed for use in accelerated aging tests. A poly (ethylene-co-vinyl acetate) (EVA) formulation often used in veteran PV installations was studied using a compressive shear test - to quantify the strength of attachment at the EVA/glass interface. Replicate laminated glass/polymer/glass coupon specimens were weathered at 12 institutions using a variety of indoor chambers or field aging. Shear strength, shear strain, and toughness were measured using a mechanical load-frame for the compressive shear test, with subsequent optical imaging and electron microscopy of the separated surfaces.
Some may say that PV modules are moving toward being a simple commodity, but most major PV customers ask: 'How can I minimize chances of a module recall?' Or, 'How can I quantify the added value of a 'premium' module?' Or, 'How can I assess the value of an old PV system that I'm thinking of purchasing?' These are all questions that PVQAT (the International PV Quality Assurance Task Force) and partner organizations are working to answer. Defining standard methods for ensuring minimal acceptable quality of PV modules, differentiating modules that provide added value in the toughest of environments, and creating a process (e.g. through IECRE [1]) that can follow a PV system from design through installation and operation are tough tasks, but having standard approaches for these will increase confidence, reduce costs, and be a critical foundation of a mature PV industry. This paper summarizes current needs for new tests, some challenges for defining those tests, and some of the key efforts toward development of international standards, emphasizing that meaningful quantification of reliability (as in defining a service life prediction) must be done in the context of a specific product with design parameters defined through a quality management system.
This paper describes an effort to inspect and evaluate PV modules in order to determine what failure or degradation modes are occurring in field installations. This paper will report on the results of six site visits, including the Sacramento Municipal Utility District (SMUD) Hedge Array, Tucson Electric Power (TEP) Springerville, Central Florida Utility, Florida Solar Energy Center (FSEC), the TEP Solar Test Yard, and University of Toledo installations. The effort here makes use of a recently developed field inspection data collection protocol, and the results were input into a corresponding database. The results of this work have also been used to develop a draft of the IEC standard for climate and application specific accelerated stress testing beyond module qualification. TEP Solar Test Yard, and University of Toledo installations. The effort here makes use of a recently developed field inspection data collection protocol, and the results were input into a corresponding database. The results of this work have also been used to develop a draft of the IEC standard for climate and application specific accelerated stress testing beyond module qualification. TEP Solar Test Yard, and University of Toledo installations. The effort here makes use of a recently developed field inspection data collection protocol, and the results were input into a corresponding database. The results of this work have also been used to develop a draft of the IEC standard for climate and application specific accelerated stress testing beyond module qualification.