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Korechoff, Robert

Publications and source records attributed to Korechoff, Robert.

Corner cube model for internal metrology system of Space Interferometer Mission (SIM)

A corner cube (CC) articulation model has been developed to evaluate the SIM internal metrology (IntMet) optical delay bias (with the accuracy of picometer) due to the component imperfections, such as vertex offset, reflection coating index error, dihedral error, and surface figure error at each facet. This physics-based and MATLAB-implemented geometric optics model provides useful guidance on the flight system design, integration, and characterization. The first portion of this paper covers the CC model details. Then several feature of the model, such as metrology beam footprint visualization, roofline straddling/crossing analysis, and application to drive the sub-system design and the error budget flow-down, are demonstrated in the second part.

Corner cube,↗

Compact, Precise Inertial Rotation Sensors for Spacecraft

A document describes a concept for an inertial sensor for measuring the rotation of an inertially stable spacecraft around its center of gravity to within 100 microarcseconds or possibly even higher precision. Whereas a current proposal for a spacecraft-rotation sensor of this accuracy requires one spacecraft dimension on the order of ten meters, a sensor according to this proposal could fit within a package smaller than 1 meter and would have less than a tenth of the mass. According to the concept, an inertial mass and an apparatus for monitoring the mass would be placed at some known distance from the center of gravity so that any rotation of the spacecraft would cause relative motion between the mass and the spacecraft. The relative motion would be measured and, once the displacement of the mass exceeded a prescribed range, a precisely monitored restoring force would be applied to return the mass to a predetermined position. Measurements of the relative motion and restoring force would provide information on changes in the attitude of the spacecraft. A history of relative motion and restoring-force measurements could be kept, enabling determination of the cumulative change in attitude during the observation time.

Rosing, David↗

Mask Design for the Space Interferometry Mission Internal Metrology

This slide presentation reviews the mask design used for the internal metrology of the Space Interferometry Mission (SIM). Included is information about the project, the method of measurements with SIM, the internal metrology, numerical model of internal metrology, wavefront examples, performance metrics, and mask design

interferometry↗

Error Modeling of Multi-baseline Optical Truss: Application to SIM Metrology Truss Field Dependent Error - Part II

The current design of the Space Interferometry Mission (SIM) employs a 19 laser-metrology-beam system (also called L19 external metrology truss) to monitor changes of distances between the fiducials of the flight system's multiple baselines. The function of the external metrology truss is to aid in the determination of the time-variations of the interferometer baseline. The largest contributor to truss error occurs in SIM wide-angle observations when the articulation of the siderostat mirrors (in order to gather starlight from different sky coordinates) brings to light systematic errors due to offsets at levels of instrument components (which include comer cube retro-reflectors, etc.). This error is labeled external metrology wide-angle field-dependent error. Physics-based model of field-dependent error at single metrology gauge level is developed and linearly propagated to errors in interferometer delay. In this manner delay error sensitivity to various error parameters or their combination can be studied using eigenvalue/eigenvector analysis. Also validation of physics-based field-dependent model on SIM testbed lends support to the present approach. As a first example, dihedral error model is developed for the comer cubes (CC) attached to the siderostat mirrors. Then the delay errors due to this effect can be characterized using the eigenvectors of composite CC dihedral error. The essence of the linear error model is contained in an error-mapping matrix. A corresponding Zernike component matrix approach is developed in parallel, first for convenience of describing the RMS of errors across the field-of-regard (FOR), and second for convenience of combining with additional models. Average and worst case residual errors are computed when various orders of field-dependent terms are removed from the delay error. Results of the residual errors are important in arriving at external metrology system component requirements. Double CCs with ideally co-incident vertices reside with the siderostat. The non-common vertex error (NCVE) is treated as a second example. Finally combination of models, and various other errors are discussed.

comer cube retro-reflector↗