Engineering topics

Kumar, Akash

Publications and source records attributed to Kumar, Akash.

11 records

DOE OSTI2023

Examining Light-Induced Degradation with Combined-Accelerated Stress Testing

While further understanding is sought, the results suggest that a module can show no degradation in performance through a qualification test light soak, (IEC 61215: 2021 MQT 19.1 requirement of 10 kW minimum on one side). Yet, such cells may degrade significantly by LID under conditions within the statistical extremes of the natural environment applied in combined-accelerated stress testing (CAST).

combined-accelerated stress testing↗

DOE OSTI2023

Comparative Analysis of Hotspot Stress Endurance in Pristine and Thermal Cycled Prestressed Glass–Glass Photovoltaic Modules

Hotspots pose a significant long-term reliability challenge in photovoltaic (PV) modules that can have a detrimental impact on the efficiency, safety, and financial viability of a PV system. This paper aims to evaluate the endurance of hotspot stress in pristine and prestressed glass–glass (GG) modules. The accelerated prestressing was conducted for 600 thermal cycles (TC600) to represent decades of field exposure. GG modules are quickly becoming an alternative to the traditional glass–backsheet (GB) modules that have been the industry standard. Unlike other conventional studies that subject only pristine modules to hotspot stress, this paper evaluates the performance of an accelerated/simulated field-aged GG module (using TC600) and a pristine GG module. Pre- and post-characterizations were performed before and after each test to determine changes in electrical performance and observe any defects in GG modules. During the hotspot test, an approximately 200 °C maximum cell temperature was observed with a cell shading of 25% (the worst-case shading ratio). After the hotspot test, electroluminescence imaging indicated that most cells in the prestressed GG module exhibited severe damage whereas no significant defects were evident in the pristine GG module where the prestressed GG module degraded 8.2% and the pristine GG module degraded 1.5% in maximum power. These findings are critical for the industry, considering that GG bifacial modules will dominate the market.

14 SOLAR ENERGY↗

DOE OSTI2023

Potential induced degradation in c-Si glass-glass modules after extended damp heat stress

Traditional Glass-Backsheet (GB) photovoltaic (PV) modules have been the industry standard for a long time, but the Glass-Glass (GG) modules are quickly rising in popularity. PV modules installed in hot-humid climates with high string voltages can undergo potential induced degradation (PID). So far, to the best of our knowledge, only fresh modules with strong interfacial adhesion have been investigated for PID. However, in reality, the PV modules have weak interfacial adhesion after a few years of field exposure. Therefore, it is essential to evaluate PV modules with weakened interfaces. In this study, we investigated the PID susceptibility of PV modules with weakened interfaces after subjecting them to 2000 hours of damp heat (DH2000) at 85°C/85% relative humidity (RH) in an accelerated environmental chamber. Fresh GG modules were also stressed for PID to compare with PID degradation of DH-stressed modules. Pre- and post-characterization tests were done before, between, and after each stress method to determine the changes in electrical performance, cell metallization properties, and hotspot properties. It is observed that fresh GG modules showed little/no degradation (less than 1%) in maximum power (Pmax), whereas the GG modules that underwent sequential DH and PID degraded by 11% to 12%. Potential mechanisms for these degradations are also presented. Furthermore, the results presented in this study are critical for the industry, considering that the bifacial modules with GG construction will be dominant in the next 10 years.

14 SOLAR ENERGY↗

DOE OSTI2022

Extended Accelerated Stress Testing (EAST) of Glass/Glass, Glass/Backsheet and Glass/Transparent Backsheet PV Modules: Influence of EVA and POE Encapsulants: Preprint

This paper presents the indoor extended accelerated stress testing (EAST) results of glass/glass (GG), glass/backsheet (GB) and glass/transparent backsheet (GT) modules having identical cells and two different encapsulant types, ethyl-vinyl-acetate (EVA) and polyolefin-elastomer (POE). Six 4-cell modules having the above-mentioned construction combinations were subjected to extended ultraviolet (UV; 600 kWh/m2), damp-heat (DH; 2000 hours) and thermal-cycling (TC; 600 cycles) tests. The post-stress UV fluorescent imaging, electroluminescent imaging, reflectance spectrophotometry and colorimetry results indicated that the grid finger degradation and encapsulant browning are slightly higher in the GG modules compared to the GB modules. The post-stress IV test results indicated, in general, that the GG/EVA modules tend to perform inferior to the GG/POE modules with the EAST evaluation.

EVA↗

DOE OSTI2022

Evaluation of Bifacial Modules and PV Technologies with Combined-Accelerated Stress Testing

In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. This is attributed to previous x-ray topography work showing higher stress in cells in glass-glass modules than glass backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. Finally, among multiple cell degradation modes that we observed such as light-induced degradation (LID), we differentiated susceptibility to potential-induced degradation (PID) on the back of the bifacial Passivated Emitter Back Cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass/glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while -1200 V system voltage is applied in C-AST, supporting the conclusion that this module type would be susceptible to PID in the field.

bifacial modules↗

DOE OSTI2022

Hotspot testing of glass/backsheet and glass/glass PV modules pre-stressed in extended thermal cycling

This paper investigates the effect of hotspot (HS) stress endurance of two of the latest designs of monocrystalline modules: a half-cell glass/backsheet (G/B) module and a full-cell glass/glass (G/G) module. These modules have already been pre-stressed in extended thermal cycling with 600 cycles per the IEC 61215 standard to represent field-stressed modules. This study differs from the other conventional studies wherein only fresh modules are subjected to hotspot endurance stress. The G/G module reached a maximum temperature of approximately 200 °C at a cell shading of 25 %, 55 °C higher than the maximum hotspot temperature of 145 °C in the G/B module. A significant burn mark, without glass shattering, was observed in the hotspot-stressed cell of the G/G module due to the current mismatch induced by partial shading. Most of the cells in the G/G module appear to be severely damaged (severe dark areas), as observed in the electroluminescence (EL) image, while the dark regions were rarely present in the G/B module. The EL image also illustrates multiple cell cracks that resist current flow and eventually contribute to the full-cell module degradation. About 8.3 % degradation in maximum power was observed for the G/G module and 1.3 % for the G/B module after the sequential stress tests. The lower degradation in the G/B module can potentially be attributed to its design, which comprises of two parallel strings, each having 72-half-cells and benefits from lower heat dissipation. Furthermore, this indicates that the half-cell design could potentially minimize the hotspot degradation and failures in crystalline-silicon modules.

14 SOLAR ENERGY↗

DOE OSTI2022

Reliability Evaluation of Bifacial and Monofacial Glass/Glass Modules with EVA and non-EVA Encapsulants

The market share for bifacial modules is projected to be doubled from 30% to 60% in the next ten years. For the monofacial crystalline silicon glass/backsheet (G/B) modules, extensive reliability data has been available for over 40 years. However, practically little/no long-term field or accelerated reliability test data is available for the new generation glass/glass (G/G) bifacial modules and glass/transparent (G/T) bifacial modules. Therefore, the primary motivation of this project was to identify the reliability strengths and weaknesses of new generation G/G modules compared to G/B modules. In this 3-year project, the goal was to objectively recommend the best construction materials for the new generation G/G (bifacial) modules through a systematic experimental approach with appropriate tasks including: Evaluation of field retrieved old-generation G/G modules; Inspection of new-generation G/G modules installed in the plants; Evaluation of new-generation G/G, G/B and G/T modules using EAST (Extended Accelerated Stress Testing), CAST (Combined Accelerated Stress Testing) and FAST (Field Accelerated Stress Testing); and, dynamic literature search and review. Major accomplishments and outcomes of this project are: Accomplishments: Evaluated more than 60 field retrieved modules and constructed and characterized more than 135 mini-modules with three substrate types (G, B, and T), two encapsulant types (EVA and POE), and two cell types (monofacial and bifacial) as well as evaluated more than 30 commercial G/G and G/B modules; Subjected all the modules to multitude characterization tests and various indoor and outdoor accelerated stress tests including FAST (Field Accelerated Stress Testing), EAST (Extended Accelerated Stress Testing), and CAST (Combined Accelerated Stress Testing) to identify and correlate the failure modes in both field and lab tests. Outcomes: Based on the accelerated test results and handling/mounting experience obtained in this project, the recommended best construction for the glass/glass modules is: “Framed GG modules with cut-cells and POE encapsulant (UVpass front; UVpass back).” However, from a statistical and manufacturing point of view (along with stakeholders surveys), the following cautionary notes are added to the above-mentioned recommendation: (i) Cut cells could introduce a higher level of manufacturing issues, including a higher number of cell interconnects; (ii) POE encapsulant is more expensive than EVA and could present a delamination risk and lower throughput during manufacturing due to lower adhesion strength. Other encapsulants, such as coextruded EPE (EVA/POE/EVA), are also recommended to be investigated. The potential public benefit of the proposed project is to present the strengths and weaknesses of glass/glass modules, so an informed procurement decision can be made.

14 SOLAR ENERGY↗

DOE OSTI2022

Evaluation of bifacial module technologies with combined–accelerated stress testing

In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. Furthermore, this is attributed to previous X-ray topography and modeling work showing higher stress in cells and interconnections in glass-glass modules than glass-backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. We found light-induced degradation (LID) in module types with regenerated (inactive) cells with C-AST, suggesting the possibility of LID destabilization in some field conditions. We could also distinguish potential-induced degradation (PID) on the back of the bifacial passivated emitter and rear cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass-glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while –1200 V system voltage is applied in C-AST, supporting the conclusion that this module type with glass-glass construction would be susceptible to PID in the field.

14 SOLAR ENERGY↗

DOE OSTI2021

Field Accelerated Stress Testing (FAST): Forecasting Plant-specific Failure Modes and Degradation Rates

Photovoltaic plant owners and insurance companies would like to be prepared for the forthcoming material warranty claims (material defects) and power warranty claims (degradation rate). To address the needs of these stakeholders, this presentation aims to introduce a new conceptual approach to perform accelerated testing right at the field of interest and it is called field accelerated stress testing (FAST). The primary goal of this presentation is to present a conceptual approach to forecast the field specific failure modes and degradation rates in advance by a factor of 2 to 5, right at the plant site using a few spare modules available at the plant location itself.

14 SOLAR ENERGY↗

DOE OSTI2020

Reliability Analysis of Field-aged Glass/Glass PV Modules: Influence of Different Encapsulant Types

This paper presents a preliminary reliability analysis of field-aged glass/glass (G/G) PV modules. Several characterization tests were performed on more than 60 modules with two different encapsulant types (EVA and ionomer) exposed in hot-dry Arizona (AZ) climate over 10-35 years. The common degradation mode observed in both encapsulant types was the delamination of encapsulant along with encapsulant browning (EVA only), glass cracking (EVA only), and metallic corrosion over junction box area (ionomer only). The EVA encapsulated G/G modules showed the higher median power degradation rate at 0.91-1.99%/yr whereas modules with ionomer showed the lower at 0.21%/yr.

photovoltaic, failures, field exposed, glass/glass↗

DOE OSTI2020

Field Reliability of Glass/Glass Modules

A review of literature indicates that there will be a 20% increase in utilization of glass/glass PV modules by 2023. Common degradation modes reported in literature of glass/glass modules are: Encapsulant delamination, Encapsulant browning, corrosion and glass cracks. There is a strong need to investigate the reliability of glass/glass modules in detail to identify and overcome any potential failures in the future constructions. This work presents a preliminary literature review on the reliability of old generation glass/glass modules in the field.

14 SOLAR ENERGY↗