Performance of a Phonon-Mediated MKID Device at the NEXUS Low-Background Facility
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72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
Engineering topics
Kurinsky, N.
Publications and source records attributed to Kurinsky, N..
Epoxy IR Filters for Superconducting Resonators
Infrared radiation leakage through dielectrics in coaxial cabling can create unwanted quasiparticles in superconducting resonators if allowed to reach devices unattenuated. Modern experimental setups commonly incorporate epoxy-based filter blocks on readout and control lines in order to mitigate this effect; however, most of these multi-channel designs require specialized mounting hardware. Here, this investigation details the design and construction of single-channel inline infrared filters, and finds that their installation in the readout system for an aluminum resonator increased its quality factor by an average of 12% across a range of operating temperatures and powers. The option to incorporate general-purpose inline filters instead of designing custom filter blocks and mounts should prove more convenient for many newer experiments.
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
Measuring the impact ionization and charge trapping probabilities in SuperCDMS HVeV phonon sensing detectors
A 0.93 g 1×1×0.4 cm 3 SuperCDMS silicon HVeV detector operated at 30 mK was illuminated by 1.91 eV photons using a room temperature pulsed laser coupled to the cryostat via fiber optic. In this work, the detector’s response under a variety of specific operating conditions was used to study the detector leakage current, charge trapping, and impact ionization in the high-purity Si substrate. The measured probabilities for a charge carrier in the detector to undergo charge trapping (0.713±0.093%) or cause impact ionization (1.576±0.110%) were found to be nearly independent of bias polarity and charge-carrier type (electron or hole) for substrate biases of ±140 V.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors
A model for charge trapping and impact ionization, and an experiment to measure these parameters is presented for the SuperCDMS HVeV detector. A procedure to isolate and quantify the main sources of noise (bulk and surface charge leakage) in the measurements is also describe. This sets the stage to precisely measure the charge trapping and impact ionization probabilities in order to incorporate this model into future dark matter searches.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗