Engineering topics

Label, Ken

Publications and source records attributed to Label, Ken.

6 records

NASA NTRS2019

Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

The goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C. The devices under test will be referenced as the DUT or RTG4 Rev C throughout this document. The DUT was configured to have various test structures that are geared to measure specific potential susceptibilities of the device. DesignDevice susceptibility was determined by monitoring the DUT for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) was checked throughout heavy-ion testing by monitoring device current.

Field Programmable Gate Array (FPGA)↗

NASA NTRS2018

Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

This is an independent investigation that evaluates the single event destructive and transient susceptibility of the Xilinx Kintex-UltraScale device. Design/Device susceptibility is determined by monitoring the device under test (DUT) for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) is monitored throughout heavy-ion testing by examining device current. This device does not have embedded mitigation. Hence, user implemented mitigation is investigated using Synopsys mitigation tools.

Single Event Transient (SET)↗

NASA NTRS2017

New Developments in Error Detection and Correction Strategies for Critical Applications

The presentation will cover a variety of mitigation strategies that were developed for critical applications. An emphasis is placed on strengths and weaknesses per mitigation technique as it pertains to different Field programmable gate array (FPGA) device types.

Triple modular redundancy (TMR)↗

NASA NTRS2004

Living with a Star (LWS) Space Environment Testbeds (SET), Mission Carrier Overview and Capabilities

NASA has initiated the Living With a Star (LWS) Program to develop the scientific understanding to address the aspects of the Connected Sun-Earth system that affect life and society. A goal of the program is to bridge the gap between science, engineering, and user application communities. This will enable future science, operational, and commercial objectives in space and atmospheric environments by improving engineering approaches to the accommodation and/or mitigation of the effects of solar variability on technological systems. The three program elements of the LWS Program are Science Missions; Targeted Research and Technology; and Space Environment Testbeds (SETS). SET is an ideal platform for small experiments performing research on space environment effects on technologies and on the mitigation of space weather effects. A short description of the LWS Program will be given, and the SET will be described in detail, giving the mission objectives, available carrier services, and upcoming flight opportunities.

Patschke, Robert↗

NASA NTRS1992

Small Explorer Data System MIL-STD-1773 fiber optic bus

The MIL-STD-1773 Fiber Optic Data Bus as implemented in the GSFC Small Explorer Data System (SEDS) for the Small Explorer Program is described. It provides an overview of the SEDS MIL-STD-1773 bus components system design considerations, reliability figures, acceptance and qualification testing requirements, radiation requirements and tests, error handling considerations, and component heritage. The first mission using the bus will be launched in June of 1992.

Flanegan, Mark↗

NASA NTRS1991

Transient SEUs in a fiber optic system for space applications

The results of an investigation on the SEU sensitivity for a fiber optic operating system are reported. Measurements were made on the upset cross sections for the system in static and dynamic modes of operation. The heavy ion SEU test facility at Brookhaven and the proton facility at Harvard University were used in this study. Cross sections were obtained for Honeywell transmitter and reciever devices operating in a system at a frequency of 100 kHz. Both devices were independently irradiated. The results show that the dynamic mode was the worst case, and the receiver was the most sensitive part type in the system. The threshold linear energy transfer (LET) for the receiver was determined to be 1.6 MeV sq cm/mg for the three input signals used in the tests, which were: a continuous high state, a low state, and a 100 kHz square wave.

Label, Ken↗