Strain-Rate Dependence of the Martensitic Transformation Behavior in a 10 Pct Ni Multi-phase Steel Under Compression
Abstract not provided
Engineering topics
Publications and source records attributed to Lambert, P. K..
Abstract not provided
Here, we demonstrate the use of X-ray phase contrast imaging with sub-microsecond temporal resolution to obtain quantitative visualization of dynamic fracture processes in brittle solids. We examine an amorphous solid (fused silica), a ceramic single crystal (single-crystal quartz), and a polycrystalline ceramic (boron carbide), in the form of single-edge notched specimens loaded using a three-point apparatus at nominal strain rates up to ~800 s -1 . We observe that the crack tip speed for boron carbide is relatively independent of mode I stress intensity factor rate ($\dot{K}$ I ) for these rates of loading, while that of fused silica and single-crystal quartz increases with $\dot{K}$ I . Further, for the amorphous and single crystal cases, we observe the development of a crack tip instability in the form of crack branching as the crack tip speed approaches 45% of the Rayleigh wave speed. This suggests that strain-rate-dependent mechanisms contribute to crack branching. Such mechanisms may, in turn, affect the macroscopic fracture properties of these materials.
We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ∼10{sup 3}–10{sup 4} s{sup −1} in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10–20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (∼40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.