Engineering topics
Lauer, Kenneth
Publications and source records attributed to Lauer, Kenneth.
Hard x-ray nanoprobe facility at the National Synchroton Light Source II
The Hard X-ray Nanoprobe (HXN) Beamline [1] of the National Synchrotron Light Source II (NSLS-II) is now available for general user experiments. This beamline was developed with the world’s most ambitious resolution goal for hard x-rays. Its initial performance target is to enable x-ray imaging experiments at a resolution of 10 nm, with an ultimate goal of reaching ~1 nm.
Achieving Hard X-ray Nanofocusing Using a Wedged Multilayer Laue Lens
Here, we report on the fabrication and the characterization of a wedged multilayer Laue lens for x-ray nanofocusing. The lens was fabricated using a sputtering deposition technique, in which a specially designed mask was employed to introduce a thickness gradient in the lateral direction of the multilayer. X-ray characterization shows an efficiency of 27% and a focus size of 26 nm at 14.6 keV, in a good agreement with theoretical calculations. Our results indicate that the desired wedging is achieved in the fabricated structure. Furthermore, we anticipate that continuous development on wedged MLLs will advance x-ray nanofocusing optics to new frontiers and enrich capabilities and opportunities for hard X-ray microscopy.
Performance and characterization of a MEMS-based device for alignment and manipulation of x-ray nanofocusing optics
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