Modifications of local structures of Gd{sub 2}O{sub 3} on incorporation of SiO{sub 2}
In the present work we have reported the results of investigations on local structures of e-beam evaporated (Gd{sub 2}O{sub 3}-SiO{sub 2}) composite thin films by synchrotron based EXAFS measurements. The evolution of local structure in the case of the Gd{sub 2}O{sub 3}-SiO{sub 2} system is found to be different from the HfO{sub 2}-SiO{sub 2} system reported by us earlier. The EXAFS analysis has shown that the Gd-O bond length decreases monotonically as SiO{sub 2} content in the films increases. Also the amplitudes of the peaks in the FT-EXAFS spectra of the samples, which depend jointly on the coordination numbers as well as the Debye-Waller factors (measure of disorder) are found to decrease monotonically with increase in SiO{sub 2} contents in the Gd{sub 2}O{sub 3} matrix. Atomic force microscopy (AFM) measurements of the samples also show continuous evolution of amorphous-like denser microstructure with increase in SiO{sub 2} content in the films. Hence incorporation of SiO{sub 2} in the Gd{sub 2}O{sub 3} matrix, results in a continuous change in oxygen coordination yielding a change in the Gd-O bond length and also results in a continuous increase in amorphousness and a smoother morphology of the samples and, unlike the HfO{sub 2}-SiO{sub 2} system, does not show any maximum for a particular SiO{sub 2} concentration.