Precision Cryogenic Dilatometer
A dilatometer based on a laser interferometer is being developed to measure mechanical creep and coefficients of thermal expansion (CTEs) of materials at temperatures ranging from ambient down to 15 K. This cryogenic dilatometer has been designed to minimize systematic errors that limit the best previously available dilatometers. At its prototype stage of development, this cryogenic dilatometer yields a strain measurement error of 35 ppb or 1.7 ppb/K CTE measurement error for a 20-K thermal load, for low-expansion materials in the temperature range from 310 down to 30 K. Planned further design refinements that include a provision for stabilization of the laser and addition of a high-precision sample-holding jig are expected to reduce the measurement error to 5-ppb strain error or 0.3-ppb/K CTE error for a 20-K thermal load. The dilatometer (see figure) includes a common-path, differential, heterodyne interferometer; a dual-frequency, stabilized source bench that serves as the light source for the interferometer; a cryogenic chamber in which one places the material sample to be studied; a cryogenic system for cooling the interior of the chamber to the measurement temperature; an ultra-stable alignment stage for positioning the chamber so that the sample is properly positioned with respect to the interferometer; and a data-acquisition and control system. The cryogenic chamber and the interferometer portion of the dilatometer are housed in a vacuum chamber on top of a vibration isolating optical table in a cleanroom. The sample consists of two pieces a pillar on a base both made of the same material. Using reflections of the interferometer beams from the base and the top of the pillar, what is measured is the change in length of the pillar as the temperature in the chamber is changed. In their fundamental optical and electronic principles of operation, the laser light source and the interferometer are similar to those described in Common-Path Heterodyne Interferometers (NPO-20786), NASA Tech Briefs, Vol. 25, No. 7 (July 2001), page 12a, and Interferometer for Measuring Displacement to Within 20 pm (NPO- 21221), NASA Tech Briefs, Vol. 27, No. 7 (July 2003), page 8a. However, the present designs incorporate a number of special geometric, optical, and mechanical features to minimize optical and thermal-expansion effects that contribute to measurement errors. These features include the use of low-thermal expansion materials for structural components, kinematic mounting and symmetrical placement of optical components, and several measures taken to minimize spurious reflections of laser beams.