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Liu, Jyh-Charn

Publications and source records attributed to Liu, Jyh-Charn.

Study on advanced information processing system

Issues related to the reliability of a redundant system with large main memory are addressed. In particular, the Fault-Tolerant Processor (FTP) for Advanced Launch System (ALS) is used as a basis for our presentation. When the system is free of latent faults, the probability of system crash due to nearly-coincident channel faults is shown to be insignificant even when the outputs of computing channels are infrequently voted on. In particular, using channel error maskers (CEMs) is shown to improve reliability more effectively than increasing the number of channels for applications with long mission times. Even without using a voter, most memory errors can be immediately corrected by CEMs implemented with conventional coding techniques. In addition to their ability to enhance system reliability, CEMs--with a low hardware overhead--can be used to reduce not only the need of memory realignment, but also the time required to realign channel memories in case, albeit rare, such a need arises. Using CEMs, we have developed two schemes, called Scheme 1 and Scheme 2, to solve the memory realignment problem. In both schemes, most errors are corrected by CEMs, and the remaining errors are masked by a voter.

Shin, Kang G.

A RAM architecture for concurrent access and on-chip testing

A novel RAM architecture supporting concurrent memory access and on-chip testing (CMAT) is proposed. A large-capacity memory chip is decomposed into test neighborhoods (TNDs), each of which is tested independently. When there are data stored in a TND, the data are saved into a buffer before testing the TND, and the TND's contents are restored using buffered data after testing the TND. If an external request is not made to the TND, the request can be directed to the addressed memory cells. Otherwise, the buffered data can be loaded back into the TND, or the request is detoured to a corresponding buffer. By deriving an analytical model, the performance penalty and hardware overhead of the CMAT architecture are shown to be very small.

Liu, Jyh-Charn

Study on fault-tolerant processors for advanced launch system

Issues related to the reliability of a redundant system with large main memory are addressed. The Fault-Tolerant Processor (FTP) for the Advanced Launch System (ALS) is used as a basis for the presentation. When the system is free of latent faults, the probability of system crash due to multiple channel faults is shown to be insignificant even when voting on the outputs of computing channels is infrequent. Using channel error maskers (CEMs) is shown to improve reliability more effectively than increasing redundancy or the number of channels for applications with long mission times. Even without using a voter, most memory errors can be immediately corrected by those CEMs implemented with conventional coding techniques. In addition to their ability to enhance system reliability, CEMs (with a very low hardware overhead) can be used to dramatically reduce not only the need of memory realignment, but also the time required to realign channel memories in case, albeit rare, such a need arises. Using CEMs, two different schemes were developed to solve the memory realignment problem. In both schemes, most errors are corrected by CEMs, and the remaining errors are masked by a voter.

Shin, Kang G.