Engineering topics
Publications and source records attributed to Liu, M. N..
The authors report a design improvement for CMOS static memory circuits hardened against single event upset (SEU) using a recently proposed logic/circuit design technique. This improvement drastically reduces static power consumption, reduces the number of transistors required in a D flip-flop design, and eliminates the possibility of capturing an upset state in the slave section during a clock transition.
An iterative logic array (ILA) architecture for synchronous sequential circuits is presented. This technique utilizes linear algebra to produce the design equations. The ILA realization of synchronous sequential logic can be fully automated with a computer program. A programmable design procedure is proposed to fullfill the design task and layout generation. A software algorithm in the C language has been developed and tested to generate 1 micron CMOS layouts using the Hewlett-Packard FUNGEN module generator shell.
The iterative logic array (ILA) is introduced as a new architecture for asynchronous sequential circuits. This is the first ILA architecture for sequential circuits reported in the literature. The ILA architecture produces a very regular circuit structure. Moreover, it is immune to both 1-1 and 0-0 crossovers and is free of hazards. This paper also presents a new critical race free STT state assignment which produces a simple form of design equations that greatly simplifies the ILA realizations.