Search NASA⌕ Search

Engineering topics

Loubriel, Guillermo M.

Publications and source records attributed to Loubriel, Guillermo M..

6 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2018

Defect screening method for electronic circuits and circuit components using power spectrum anaylysis

A method involving the non-destructive testing of a sample electrical or electronic device is provided. The method includes measuring a power spectrum of the device and performing a Principal Component Analysis on the power spectrum, thereby to obtain a set of principal components of the power spectrum. The method further includes selecting a subset consisting of some of the principal components, and comparing the subset to stored reference data that include representations in terms of principal components of one or more reference populations of devices. Based at least partly on the comparison, the sample device is classified relative to the reference populations.

Tangyunyong, Paiboon↗
DOE OSTI2018

Scanning method for screening of electronic devices

A visualization method for screening electronic devices is provided. In accordance with the disclosed method, a probe is applied to a grid of multiple points on the circuit, and an output produced by the circuit in response to the stimulus waveform is monitored for each of multiple grid points where the probe is applied. A power spectrum analysis (PSA) produces a power spectrum amplitude, in each of one or more frequency bins, on the monitored output for each of the multiple grid points. The PSA provides a respective pixel value for each of the multiple grid points. An image is displayed, in which image portions representing the multiple grid points are displayed with the respective pixel values.

47 OTHER INSTRUMENTATION↗