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Ludwig, Larry

Publications and source records attributed to Ludwig, Larry.

5 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2009

An Empirical Model for Estimating the Probability of Electrical Short Circuits from Tin Whiskers

In this experiment, an empirical model to quantify the probability of occurrence of an electrical short circuit from tin whiskers as a function of voltage was developed. This empirical model can be used to improve existing risk simulation models. FIB and TEM images of a tin whisker confirm the rare polycrystalline structure on one of the three whiskers studied. FIB cross-section of the card guides verified that the tin finish was bright tin.

Courey, Karim↗
NASA NTRS2008

An Empirical Model for Estimating the Probability of Electrical Short Circuits from Tin Whiskers-Part I

Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that has a currently unknown probability associated with it. Due to contact resistance, electrical shorts may not occur at lower voltage levels. In this experiment, we study the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From this data, we can estimate the probability of an electrical short, as a function of voltage, given that a free tin whisker has bridged two adjacent exposed electrical conductors. In addition, three tin whiskers grown from the same Space Shuttle Orbiter card guide used in the aforementioned experiment were cross sectioned and studied using a focused ion beam (FIB).

Courey, Karim↗
NASA NTRS1996

Interfacing LabVIEW With Instrumentation for Electronic Failure Analysis and Beyond

The Laboratory Virtual Instrumentation Engineering Workstation (LabVIEW) software is designed such that equipment and processes related to control systems can be operationally lined and controlled by the use of a computer. Various processes within the failure analysis laboratories of NASA's Kennedy Space Center (KSC) demonstrate the need for modernization and, in some cases, automation, using LabVIEW. An examination of procedures and practices with the Failure Analaysis Laboratory resulted in the conclusion that some device was necessary to elevate the potential users of LabVIEW to an operational level in minimum time. This paper outlines the process involved in creating a tutorial application to enable personnel to apply LabVIEW to their specific projects. Suggestions for furthering the extent to which LabVIEW is used are provided in the areas of data acquisition and process control.

Buchanan, Randy K.↗